Improved Path Recovery in Pseudo Functional Path Delay Test Using Extended Value Algebra

2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) ◽

10.1109/vlsid.2017.63 ◽

2017 ◽

Author(s):

Prasenjit Biswas ◽

D. M. H. Walker

Keyword(s):

Path Delay ◽

Delay Test ◽

Extended Value ◽

Path Delay Test

Download Full-text

Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Cited By ~ 18

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Path Delay ◽

Power Supply Noise ◽

Delay Test ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

Download Full-text

Techniques to Improve the Efficiency of SAT Based Path Delay Test Generation

2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems ◽

10.1109/vlsid.2014.16 ◽

2014 ◽

Cited By ~ 1

Author(s):

Kun Bian ◽

D.M.H. Walker ◽

Sunil P. Khatri

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

New Perspectives on Core In-field Path Delay Test

2020 IEEE International Test Conference (ITC) ◽

10.1109/itc44778.2020.9325260 ◽

2020 ◽

Author(s):

Riccardo Cantoro ◽

Dario Foti ◽

Sandro Sartoni ◽

Matteo Sonza Reorda ◽

Lorena Anghel ◽

...

Keyword(s):

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

Multiple Coupling Effects Oriented Path Delay Test Generation

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.9 ◽

2008 ◽

Cited By ~ 2

Author(s):

Minjin Zhang ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Coupling Effects ◽

Oriented Path ◽

Path Delay Test

Download Full-text

Maximizing crosstalk-induced slowdown during path delay test

2012 IEEE 30th International Conference on Computer Design (ICCD) ◽

10.1109/iccd.2012.6378635 ◽

2012 ◽

Cited By ~ 4

Author(s):

Dibakar Gope ◽

D. M. H. Walker

Keyword(s):

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

At-Speed Path Delay Test

2015 IEEE 24th North Atlantic Test Workshop ◽

10.1109/natw.2015.13 ◽

2015 ◽

Cited By ~ 1

Author(s):

Swati Chakraborty ◽

D.M.H. Walker

Keyword(s):

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

Fastpath: a path-delay test generator for standard scan designs

Proceedings., International Test Conference ◽

10.1109/test.1994.527946 ◽

2002 ◽

Cited By ~ 46

Author(s):

B. Underwood ◽

Wai-On Law ◽

S. Kang ◽

H. Konuk

Keyword(s):

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

Efficient Path Delay Test Generation for Custom Designs

ETRI Journal ◽

10.4218/etrij.01.0101.0306 ◽

2001 ◽

Vol 23 (3) ◽

pp. 138-150 ◽

Cited By ~ 4

Author(s):

Sungho Kang Kang ◽

Bill Underwood Underwood ◽

Wai-On Law Law ◽

Haluk Konuk Konuk

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758651 ◽

2019 ◽

Author(s):

Ben Niewenhuis ◽

Balaji Ravikumar ◽

Zeye Liu ◽

R. D. Shawn Blanton

Keyword(s):

Path Delay ◽

Delay Test ◽

Path Delay Test

Download Full-text

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2179040 ◽

2012 ◽

Vol 31 (5) ◽

pp. 809-813

Author(s):

Elif Alpaslan ◽

Bram Kruseman ◽

Ananta K. Majhi ◽

Wilmar M. Heuvalman ◽

Jennifer Dworak

Keyword(s):

Power Supply ◽

Switching Noise ◽

Path Delay ◽

Delay Test ◽

Noise Effects ◽

Noise Index ◽

Index Model ◽

Model Based ◽

Path Delay Test

Download Full-text