NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test

2012 ◽  
Vol 31 (5) ◽  
pp. 809-813
Author(s):  
Elif Alpaslan ◽  
Bram Kruseman ◽  
Ananta K. Majhi ◽  
Wilmar M. Heuvalman ◽  
Jennifer Dworak
Keyword(s):  
Power Supply ◽  
Switching Noise ◽  
Path Delay ◽  
Delay Test ◽  
Noise Effects ◽  
Noise Index ◽  
Index Model ◽  
Model Based ◽  
Path Delay Test

New Perspectives on Core In-field Path Delay Test

2020 ◽  
Author(s):  
Riccardo Cantoro ◽  
Dario Foti ◽  
Sandro Sartoni ◽  
Matteo Sonza Reorda ◽  
Lorena Anghel ◽  
...  
Keyword(s):  
Path Delay ◽  
Delay Test ◽  
Path Delay Test

scholarly journals Efficient Path Delay Test Generation for Custom Designs

ETRI Journal ◽  
2001 ◽  
Vol 23 (3) ◽  
pp. 138-150 ◽  
Author(s):  
Sungho Kang Kang ◽  
Bill Underwood Underwood ◽  
Wai-On Law Law ◽  
Haluk Konuk Konuk
Keyword(s):  
Test Generation ◽  
Path Delay ◽  
Delay Test ◽  
Path Delay Test

Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle

2019 ◽  
Author(s):  
Ben Niewenhuis ◽  
Balaji Ravikumar ◽  
Zeye Liu ◽  
R. D. Shawn Blanton
Keyword(s):  
Path Delay ◽  
Delay Test ◽  
Path Delay Test
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