A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor

Young-Cheon Kwon;  Oh-Kyong Kwon

doi:10.1109/tim.2013.2291951

A Precision On-Chip Measurement Technique for Dielectric Absorption of an Integrated Capacitor

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2013.2291951 ◽

2014 ◽

Vol 63 (6) ◽

pp. 1613-1619 ◽

Cited By ~ 2

Author(s):

Young-Cheon Kwon ◽

Oh-Kyong Kwon

Keyword(s):

Measurement Technique ◽

Dielectric Absorption ◽

On Chip

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Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuit

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1986.22599 ◽

1986 ◽

Vol 33 (7) ◽

pp. 938-944 ◽

Cited By ~ 12

Author(s):

M. Furukawa ◽

H. Hatano ◽

K. Hanihara

Keyword(s):

Measurement Technique ◽

Precision Measurement ◽

Mos Capacitor ◽

On Chip

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2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) ◽

10.1109/edaps.2018.8680875 ◽

2018 ◽

Author(s):

Ankur BAL ◽

Vikram SINGH

Keyword(s):

Measurement Technique ◽

Nyquist Rate ◽

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IEICE Electronics Express ◽

10.1587/elex.12.20150570 ◽

2015 ◽

Vol 12 (15) ◽

pp. 20150570-20150570

Author(s):

Kyung-Sub Son ◽

Jin-Ku Kang

Keyword(s):

Measurement Technique ◽

Frequency Modulation ◽

Jitter Tolerance ◽

On Chip

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10.1109/apccas.2006.342497 ◽

2006 ◽

Author(s):

Ma Fan Yung

Keyword(s):

Measurement Technique ◽

Supply Voltage ◽

Voltage Measurement ◽

On Chip

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Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances

Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects ◽

10.1109/spi.2002.258287 ◽

2002 ◽

Cited By ~ 9

Author(s):

Alessandro Bogliolo ◽

Loris Vendrame ◽

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Keyword(s):

Measurement Technique ◽

Cross Coupling ◽

Selective Extraction ◽

On Chip

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10.1109/vts.2001.923466 ◽

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Author(s):

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Keyword(s):

Measurement Technique ◽

High Speed ◽

Time Interval ◽

Short Time Interval ◽

Interval Measurement ◽

Communication Links ◽

Time Interval Measurement ◽

On Chip ◽

Short Time

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2009 IEEE Asian Solid-State Circuits Conference ◽

10.1109/asscc.2009.5357165 ◽

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Author(s):

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Keyword(s):

Measurement Technique ◽

Ring Oscillator ◽

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Cited By ~ 8

Author(s):

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Keyword(s):

Defect Detection ◽

Measurement Technique ◽

Delay Measurement ◽

Small Delay ◽

On Chip

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Keyword(s):

Measurement Technique ◽

Capacitance Measurement ◽

Coupling Capacitance ◽

On Chip

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2015 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

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Keyword(s):

Measurement Technique ◽

Jitter Tolerance ◽

On Chip

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