Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances

Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects ◽

10.1109/spi.2002.258287 ◽

2002 ◽

Cited By ~ 9

Author(s):

Alessandro Bogliolo ◽

Loris Vendrame ◽

Luca Bortesi ◽

Ezio Barachetti

Keyword(s):

Measurement Technique ◽

Cross Coupling ◽

Selective Extraction ◽

On Chip

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Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuit

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1986.22599 ◽

1986 ◽

Vol 33 (7) ◽

pp. 938-944 ◽

Cited By ~ 12

Author(s):

M. Furukawa ◽

H. Hatano ◽

K. Hanihara

Keyword(s):

Measurement Technique ◽

Precision Measurement ◽

Mos Capacitor ◽

On Chip

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A novel on-chip mismatch measurement technique for Nyquist rate ADCs

2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) ◽

10.1109/edaps.2018.8680875 ◽

2018 ◽

Author(s):

Ankur BAL ◽

Vikram SINGH

Keyword(s):

Measurement Technique ◽

Nyquist Rate ◽

On Chip

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Rapid and selective extraction, isolation, preconcentration, and quantitation of small RNAs from cell lysate using on-chip isotachophoresis

Lab on a Chip ◽

10.1039/b903542g ◽

2009 ◽

Vol 9 (15) ◽

pp. 2145 ◽

Cited By ~ 50

Author(s):

Reto B. Schoch ◽

Mostafa Ronaghi ◽

Juan G. Santiago

Keyword(s):

Small Rnas ◽

Selective Extraction ◽

Cell Lysate ◽

On Chip

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Cross-coupling in 65nm fully integrated EDGE System On Chip Design and cross-coupling prevention of complex 65nm SoC

2009 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2009.5090818 ◽

2009 ◽

Author(s):

P.-H. Bonnaud ◽

G. Sommer

Keyword(s):

Cross Coupling ◽

System On Chip ◽

Chip Design ◽

Fully Integrated ◽

On Chip

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On-chip jitter tolerance measurement technique with independent jitter frequency modulation from VCO in CDR

IEICE Electronics Express ◽

10.1587/elex.12.20150570 ◽

2015 ◽

Vol 12 (15) ◽

pp. 20150570-20150570

Author(s):

Kyung-Sub Son ◽

Jin-Ku Kang

Keyword(s):

Measurement Technique ◽

Frequency Modulation ◽

Jitter Tolerance ◽

On Chip

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On-Chip Supply Voltage Measurement Technique

APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems ◽

10.1109/apccas.2006.342497 ◽

2006 ◽

Author(s):

Ma Fan Yung

Keyword(s):

Measurement Technique ◽

Supply Voltage ◽

Voltage Measurement ◽

On Chip

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A new test structure for measuring on-chip cross-coupling capacitances

Proceedings 45th Annual IEEE Symposium on Foundations of Computer Science SPI-04 ◽

10.1109/spi.2004.1409041 ◽

2005 ◽

Cited By ~ 3

Author(s):

A. Bogliolo ◽

F. Vaira ◽

L. Vendrame ◽

L. Bortesi

Keyword(s):

Cross Coupling ◽

Test Structure ◽

On Chip

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Label-Free On-Chip Selective Extraction of Cell-Aggregate-Laden Microcapsules from Oil into Aqueous Solution with Optical Sensor and Dielectrophoresis

ACS Sensors ◽

10.1021/acssensors.7b00834 ◽

2018 ◽

Vol 3 (2) ◽

pp. 410-417 ◽

Cited By ~ 6

Author(s):

Mingrui Sun ◽

Patrick Durkin ◽

Jianrong Li ◽

Thomas L. Toth ◽

Xiaoming He

Keyword(s):

Aqueous Solution ◽

Optical Sensor ◽

Selective Extraction ◽

Cell Aggregate ◽

Label Free ◽

On Chip

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An on-chip short-time interval measurement technique for testing high-speed communication links

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923466 ◽

2002 ◽

Cited By ~ 4

Author(s):

Jiun-Lang Huang ◽

Kwang-Ting Cheng

Keyword(s):

Measurement Technique ◽

High Speed ◽

Time Interval ◽

Short Time Interval ◽

Interval Measurement ◽

Communication Links ◽

Time Interval Measurement ◽

On Chip ◽

Short Time

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Deep Learning‐Enabled Label‐Free On‐Chip Detection and Selective Extraction of Cell Aggregate‐Laden Hydrogel Microcapsules

Small ◽

10.1002/smll.202102868 ◽

2021 ◽

Vol 17 (24) ◽

pp. 2102868

Author(s):

Alisa M. White ◽

Yuntian Zhang ◽

James G. Shamul ◽

Jiangsheng Xu ◽

Elyahb A. Kwizera ◽

...

Keyword(s):

Deep Learning ◽

Selective Extraction ◽

Cell Aggregate ◽

Label Free ◽

On Chip

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