Proceedings 19th IEEE VLSI Test Symposium. VTS 2001
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0769511228

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Guaranteeing quality throughout the product life cycle: on-line test and repair to the rescue

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923432 ◽

2005 ◽

Author(s):

B. Bottoms ◽

J. Chung ◽

B. Koenemann ◽

G. Shirley ◽

L. Spainhower

Keyword(s):

Life Cycle ◽

Product Life Cycle ◽

Product Life ◽

On Line ◽

Line Test

Download Full-text

Tools for the characterization of bipolar CML testability

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923467 ◽

2005 ◽

Cited By ~ 2

Author(s):

G. Monte ◽

B. Antaki ◽

S. Patenaude ◽

Y. Savaria ◽

C. Thibeault ◽

...

Download Full-text

Self-testable pipelined ADC with low hardware overhead

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923450 ◽

2002 ◽

Cited By ~ 2

Author(s):

E.J. Peralias ◽

G. Huertas ◽

A. Rueda ◽

J.L. Huertas

Keyword(s):

Pipelined Adc ◽

Hardware Overhead

Download Full-text

On the use of fault dominance in n-detection test generation

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923462 ◽

2002 ◽

Cited By ~ 10

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation

Download Full-text

MINVDD testing for weak CMOS ICs

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923459 ◽

2002 ◽

Cited By ~ 8

Author(s):

Chao-Wen Tseng ◽

R. Chen ◽

P. Nigh ◽

E.J. McCluskey

Download Full-text

Flash memory disturbances: modeling and test

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923442 ◽

2002 ◽

Cited By ~ 28

Author(s):

M.G. Mohammad ◽

K.K. Saluja

Keyword(s):

Flash Memory

Download Full-text

Diagnosis of tunneling opens

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923413 ◽

2002 ◽

Author(s):

J.C.-M. Li ◽

E.J. McCluskey

Download Full-text

Scan wheel-a technique for interfacing a high speed scan-path with a slow speed tester

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923424 ◽

2002 ◽

Cited By ~ 3

Author(s):

D.K. Bhavsar

Keyword(s):

High Speed ◽

Slow Speed ◽

Scan Path

Download Full-text

Breaking correlation to improve testability

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923421 ◽

2002 ◽

Author(s):

K. Ockunzzi ◽

C. Papachristou

Download Full-text

Burn-in failures and local region yield: an integrated field-reliability model

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 ◽

10.1109/vts.2001.923457 ◽

2002 ◽

Cited By ~ 15

Author(s):

T.S. Barnett ◽

A.D. Singh ◽

V.P. Nelson

Keyword(s):

Local Region ◽

Reliability Model ◽

Field Reliability

Download Full-text

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Guaranteeing quality throughout the product life cycle: on-line test and repair to the rescue

Tools for the characterization of bipolar CML testability

Self-testable pipelined ADC with low hardware overhead

On the use of fault dominance in n-detection test generation

MINVDD testing for weak CMOS ICs

Flash memory disturbances: modeling and test

Diagnosis of tunneling opens

Scan wheel-a technique for interfacing a high speed scan-path with a slow speed tester

Breaking correlation to improve testability

Burn-in failures and local region yield: an integrated field-reliability model

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001
Latest Publications