XLBIST: X-Tolerant Logic BIST

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Author(s):  
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J.A. Waicukauski ◽  
G.A. Maston ◽  
J.E. Colburn
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On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

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Author(s):  
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X. Wen ◽  
Y. Sato ◽  
S. Kajihara ◽  
P. Girard ◽  
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A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST

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Author(s):  
Takaaki Kato ◽  
Senling Wang ◽  
Yasuo Sato ◽  
Seiji Kajihara ◽  
Xiaoqing Wen
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Practical Challenges in Logic BIST Implementation – Case Studies

2008 ◽  
Author(s):  
Shianling Wu ◽  
Hiroshi Furukawa ◽  
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Laung-Terng Wang ◽  
Hao-Jan Chao ◽  
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scholarly journals Novel approach to reduce power droop during scan-based logic BIST

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M. Omana ◽  
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C. Metra ◽  
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scholarly journals On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

2014 ◽  
Vol E97.D (10) ◽  
pp. 2706-2718
Author(s):  
Akihiro TOMITA ◽  
Xiaoqing WEN ◽  
Yasuo SATO ◽  
Seiji KAJIHARA ◽  
Kohei MIYASE ◽  
...  
Keyword(s):  
Logic Bist ◽  
Power Safety
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