2013 22nd Asian Test Symposium
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71
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Published By IEEE

9780769550800
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

2013 ◽  
Author(s):  
A. Tomita ◽  
X. Wen ◽  
Y. Sato ◽  
S. Kajihara ◽  
P. Girard ◽  
...  
Keyword(s):  
Logic Bist ◽  
Power Safety

scholarly journals Securing Access to Reconfigurable Scan Networks

2013 ◽  
Author(s):  
Rafal Baranowski ◽  
Michael A. Kochte ◽  
Hans-Joachim Wunderlich

Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis

2013 ◽  
Author(s):  
Fangming Ye ◽  
Shi Jin ◽  
Zhaobo Zhang ◽  
Krishnendu Chakrabarty ◽  
Xinli Gu
Keyword(s):  
Fault Diagnosis ◽  
Board Level

Digital Compensation for Timing Mismatches in Interleaved ADCs

2013 ◽  
Author(s):  
Ru Yi ◽  
Minghui Wu ◽  
Koji Asami ◽  
Haruo Kobayashi ◽  
Ramin Khatami ◽  
...  
Keyword(s):  
Digital Compensation ◽  
Timing Mismatches

Mid-bond Interposer Wire Test

2013 ◽  
Author(s):  
Li-Ren Huang ◽  
Shi-Yu Huang ◽  
Kun-Han Tsai ◽  
Wu-Tung Cheng ◽  
Stephen Sunter

Automotive EEPROM Qualification and Cost Optimization

2013 ◽  
Author(s):  
Peter Sarson ◽  
Gregor Schatzberger ◽  
Robert Seitz
Keyword(s):  
Cost Optimization
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