Adaptive test flow for mixed-signal/RF circuits using learned information from device under test

Author(s):  
Ender Yilmaz ◽  
Sule Ozev ◽  
Kenneth M. Butler
Author(s):  
Haralampos-G. Stratigopoulos ◽  
Christian Streitwieser
Keyword(s):  

Author(s):  
Haruo Kobayashi ◽  
Nene Kushita ◽  
Minh Tri Tran ◽  
Koji Asami ◽  
Hao San ◽  
...  

Author(s):  
Michihiro Shintani ◽  
Takumi Uezono ◽  
Tomoyuki Takahashi ◽  
Kazumi Hatayama ◽  
Takashi Aikyo ◽  
...  

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