Accurate measurement of small delay defect coverage of test patterns

2009 ◽  
Author(s):  
Narendra Devta-Prasanna ◽  
Sandeep Kumar Goel ◽  
Arun Gunda ◽  
Mark Ward ◽  
Prabhakaran Krishnamurthy
Keyword(s):  
Defect Coverage ◽  
Small Delay

Small Delay and High Performance AD/DA Converters of Lease Circuit System for AM&FM Broadcast

2010 ◽  
Vol 130 (7) ◽  
pp. 1118-1124 ◽  
Author(s):  
Kenji Takato ◽  
Dai Suzuki ◽  
Takashi Ishii ◽  
Masato Kobayashi ◽  
Hirokazu Yamada ◽  
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High Performance ◽  
Small Delay ◽  
Fm Broadcast

Addressing Defect Coverage through Generating Test Vectors for Transistor Defects

2009 ◽  
Vol E92-A (12) ◽  
pp. 3128-3135
Author(s):  
Yoshinobu HIGAMI ◽  
Kewal K. SALUJA ◽  
Hiroshi TAKAHASHI ◽  
Shin-ya KOBAYASHI ◽  
Yuzo TAKAMATSU
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Defect Coverage ◽  
Test Vectors

scholarly journals Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

2020 ◽  
Vol 25 (5) ◽  
pp. 1-27
Author(s):  
Nektar Xama ◽  
Martin Andraud ◽  
Jhon Gomez ◽  
Baris Esen ◽  
Wim Dobbelaere ◽  
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Keyword(s):  
Machine Learning ◽  
Analog Circuits ◽  
Defect Coverage

Small delay testing for TSVs in 3-D ICs

2012 ◽  
Author(s):  
Shi-Yu Huang ◽  
Yu-Hsiang Lin ◽  
Kun-Han (Hans) Tsai ◽  
Wu-Tung Cheng ◽  
Stephen Sunter ◽  
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Keyword(s):  
Delay Testing ◽  
Small Delay

scholarly journals Defect Coverage-Driven Window-Based Test Compression

2010 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Krishnendu Chakrabarty ◽  
Emmanouil Kalligeros ◽  
Vasileios Tenentes
Keyword(s):  
Defect Coverage ◽  
Test Compression
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