Electrical Characterization of Coaxial Silicon–Insulator–Silicon Through-Silicon Vias: Theoretical Analysis and Experiments
2016 ◽
Vol 63
(12)
◽
pp. 4880-4887
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Keyword(s):
2012 ◽
Vol 22
(5)
◽
pp. 055021
◽
Keyword(s):
Keyword(s):
Capacitance Expressions and Electrical Characterization of Tapered Through- Silicon Vias for 3-D ICs
2015 ◽
Vol 5
(10)
◽
pp. 1488-1496
◽
2020 ◽
Vol 33
(1)
◽
pp. 103-108