Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique

2014 ◽  
Vol 61 (4) ◽  
pp. 936-942 ◽  
Author(s):  
Chun-Chang Lu ◽  
Kuei-Shu Chang-Liao ◽  
Che-Hao Tsao ◽  
Tien-Ko Wang ◽  
Hsueh-Chao Ko ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Charge Pumping ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

2019 ◽  
Vol 40 (4) ◽  
pp. 498-501
Author(s):  
Kai-Chun Chang ◽  
Jih-Chien Liao ◽  
Ting-Chang Chang ◽  
Chien-Hung Yeh ◽  
Chien-Yu Lin ◽  
...  
Keyword(s):  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress ◽  
Stress Degradation

Characteristics of PBTI and Hot Carrier Stress for LTPS-TFT With High-$\kappa$ Gate Dielectric

2008 ◽  
Vol 29 (2) ◽  
pp. 171-173 ◽  
Author(s):  
Ming-Wen Ma ◽  
Chih-Yang Chen ◽  
Chun-Jung Su ◽  
Woei-Cherng Wu ◽  
Yi-Hong Wu ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Hot Carrier ◽  
Hot Carrier Stress

Trap evaluations of metal/oxide/silicon field-effect transistors with high-k gate dielectric using charge pumping method

2002 ◽  
Vol 81 (11) ◽  
pp. 2050-2052 ◽  
Author(s):  
Ga-Won Lee ◽  
Jae-Hee Lee ◽  
Hae-Wang Lee ◽  
Myoung-Kyu Park ◽  
Dae-Gwan Kang ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Gate Dielectric ◽  
Field Effect Transistors ◽  
Charge Pumping ◽  
High K ◽  
Metal Oxide Silicon ◽  
High K Gate Dielectric

Reliability Mechanisms of LTPS-TFT With $\hbox{HfO}_{2}$ Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress

2008 ◽  
Vol 55 (5) ◽  
pp. 1153-1160 ◽  
Author(s):  
Ming-Wen Ma ◽  
Chih-Yang Chen ◽  
Woei-Cherng Wu ◽  
Chun-Jung Su ◽  
Kuo-Hsing Kao ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Hot Carrier ◽  
Hot Carrier Stress

Effect of substrate hot carrier stress on high-k gate stack

2008 ◽  
Author(s):  
Hokyung Park ◽  
Gennadi Bersuker ◽  
Chang Yong Kang ◽  
Chadwin Young ◽  
Hsing-Huang Tseng ◽  
...  
Keyword(s):  
Gate Stack ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress

Interface Traps Analysis in p-Type Poly-Si TFTs Under Hot Carrier Stress Using the Charge Pumping Method

2017 ◽  
Vol 17 (10) ◽  
pp. 7101-7106 ◽  
Author(s):  
Sangsub Kim ◽  
Pyungho Choi ◽  
Hyunki Kim ◽  
Soonkon Kim ◽  
Junyong Shin ◽  
...  
Keyword(s):  
Interface Traps ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
P Type
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