Reliability Mechanisms of LTPS-TFT With $\hbox{HfO}_{2}$ Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress

2008 ◽  
Vol 55 (5) ◽  
pp. 1153-1160 ◽  
Author(s):  
Ming-Wen Ma ◽  
Chih-Yang Chen ◽  
Woei-Cherng Wu ◽  
Chun-Jung Su ◽  
Kuo-Hsing Kao ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Hot Carrier ◽  
Hot Carrier Stress

Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique

2014 ◽  
Vol 61 (4) ◽  
pp. 936-942 ◽  
Author(s):  
Chun-Chang Lu ◽  
Kuei-Shu Chang-Liao ◽  
Che-Hao Tsao ◽  
Tien-Ko Wang ◽  
Hsueh-Chao Ko ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Charge Pumping ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress

Characteristics of PBTI and Hot Carrier Stress for LTPS-TFT With High-$\kappa$ Gate Dielectric

2008 ◽  
Vol 29 (2) ◽  
pp. 171-173 ◽  
Author(s):  
Ming-Wen Ma ◽  
Chih-Yang Chen ◽  
Chun-Jung Su ◽  
Woei-Cherng Wu ◽  
Yi-Hong Wu ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Hot Carrier ◽  
Hot Carrier Stress

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress

Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors

2019 ◽  
Vol 3 (5) ◽  
pp. 213-220 ◽  
Author(s):  
Min-Woo Ha ◽  
Young-Hwan Choi ◽  
Joon-Hyun Park ◽  
Kwang-Seok Seo ◽  
Min-Koo Han
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Stress Effects ◽  
Electron Mobility Transistors ◽  
Hot Carrier Stress
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