A new observation of band-to-band tunneling induced hot-carrier stress using charge-pumping technique [MOSFETs]

2000 ◽  
Vol 21 (3) ◽  
pp. 123-126 ◽  
Author(s):  
Yu-Lin Chu ◽  
Ching-Yuan Wu
Keyword(s):  
Charge Pumping ◽  
Hot Carrier ◽  
Band To Band Tunneling ◽  
Hot Carrier Stress

Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique

2014 ◽  
Vol 61 (4) ◽  
pp. 936-942 ◽  
Author(s):  
Chun-Chang Lu ◽  
Kuei-Shu Chang-Liao ◽  
Che-Hao Tsao ◽  
Tien-Ko Wang ◽  
Hsueh-Chao Ko ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Charge Pumping ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress

Interface Traps Analysis in p-Type Poly-Si TFTs Under Hot Carrier Stress Using the Charge Pumping Method

2017 ◽  
Vol 17 (10) ◽  
pp. 7101-7106 ◽  
Author(s):  
Sangsub Kim ◽  
Pyungho Choi ◽  
Hyunki Kim ◽  
Soonkon Kim ◽  
Junyong Shin ◽  
...  
Keyword(s):  
Interface Traps ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
P Type

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress
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