Characterization of Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter

2013 ◽  
Vol 60 (5) ◽  
pp. 1701-1708 ◽  
Author(s):  
Ali BenMoussa ◽  
Boris Giordanengo ◽  
Samuel Gissot ◽  
Guy Meynants ◽  
Xinyang Wang ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Backside Illuminated

AlGaN-on-Si backside illuminated photodetectors for the extreme ultraviolet (EUV) range

2010 ◽  
Author(s):  
P. E. Malinowski ◽  
J.-Y. Duboz ◽  
J. John ◽  
C. Sturdevant ◽  
J. Das ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Backside Illuminated

At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems

2000 ◽  
Vol 39 (17) ◽  
pp. 2941 ◽  
Author(s):  
Patrick Naulleau ◽  
Kenneth A. Goldberg ◽  
Eric M. Gullikson ◽  
Jeffrey Bokor
Keyword(s):  
Extreme Ultraviolet ◽  
System Level ◽  
Optical Systems

scholarly journals Direct spectrotemporal characterization of femtosecond extreme-ultraviolet pulses

2013 ◽  
Vol 88 (3) ◽  
Author(s):  
David Gauthier ◽  
Benoît Mahieu ◽  
Giovanni De Ninno
Keyword(s):  
Extreme Ultraviolet

Characterization of extreme ultraviolet emission using the fourth harmonic of a Nd:YAG laser

2005 ◽  
Vol 86 (18) ◽  
pp. 181107 ◽  
Author(s):  
Michiteru Yamaura ◽  
Shigeaki Uchida ◽  
Atsushi Sunahara ◽  
Yoshinori Shimada ◽  
Hiroaki Nishimura ◽  
...  
Keyword(s):  
Nd:Yag Laser ◽  
Extreme Ultraviolet ◽  
Ultraviolet Emission ◽  
Fourth Harmonic

scholarly journals Deposition and characterization of B4C/CeO2 multilayers at 6.x nm extreme ultraviolet wavelengths

2016 ◽  
Vol 119 (9) ◽  
pp. 095301 ◽  
Author(s):  
M. G. Sertsu ◽  
A. Giglia ◽  
S. Brose ◽  
D. Park ◽  
Z. S. Wang ◽  
...  
Keyword(s):  
Extreme Ultraviolet

Characterization of ultrafast free-electron laser pulses using extreme-ultraviolet transient gratings

2018 ◽  
Vol 25 (1) ◽  
pp. 32-38 ◽  
Author(s):  
F. Capotondi ◽  
L. Foglia ◽  
M. Kiskinova ◽  
C. Masciovecchio ◽  
R. Mincigrucci ◽  
...  
Keyword(s):  
Arrival Time ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Linear Process ◽  
Third Order ◽  
X Ray ◽  
High Pulse ◽  
Spectral Ranges ◽  
Pulse Energies

The characterization of the time structure of ultrafast photon pulses in the extreme-ultraviolet (EUV) and soft X-ray spectral ranges is of high relevance for a number of scientific applications and photon diagnostics. Such measurements can be performed following different strategies and often require large setups and rather high pulse energies. Here, high-quality measurements carried out by exploiting the transient grating process,i.e.a third-order non-linear process sensitive to the time-overlap between two crossed EUV pulses, is reported. From such measurements it is possible to obtain information on both the second-order intensity autocorrelation function and on the coherence length of the pulses. It was found that the pulse energy density needed to carry out such measurements on solid state samples can be as low as a few mJ cm−2. Furthermore, the possibility to control the arrival time of the crossed pulses independently might permit the development of a number of coherent spectroscopies in the EUV and soft X-ray regime, such as, for example, photon echo and two-dimensional spectroscopy.

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