Characterization of oxide trap energy by analysis of the SILC roll-off regime in flash memories

2006 ◽  
Vol 53 (1) ◽  
pp. 126-134 ◽  
Author(s):  
D. Ielmini ◽  
A.S. Spinelli ◽  
A. Visconti
Keyword(s):  
Flash Memories ◽  
Trap Energy ◽  
Oxide Trap

scholarly journals Characterization of hot-hole injection induced SILC and related disturbs in flash memories

2001 ◽  
Vol 48 (2) ◽  
pp. 300-306 ◽  
Author(s):  
Cherng-Ming Yih ◽  
Zhi-Hao Ho ◽  
Mong-Song Liang ◽  
S.S. Chung
Keyword(s):  
Hole Injection ◽  
Flash Memories

scholarly journals Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide

2017 ◽  
Vol 14 (8) ◽  
pp. 20170141-20170141 ◽  
Author(s):  
Younghwan Son ◽  
Yoon Kim ◽  
Myounggon Kang
Keyword(s):  
Gate Oxide ◽  
Trap Density ◽  
Charge Pumping ◽  
Oxide Trap

Characterization of an Oxide Trap Leading to Random Telegraph Noise in Gate-Induced Drain Leakage Current of DRAM Cell Transistors

2011 ◽  
Vol 58 (6) ◽  
pp. 1741-1747 ◽  
Author(s):  
Byoungchan Oh ◽  
Heung-Jae Cho ◽  
Heesang Kim ◽  
Younghwan Son ◽  
Taewook Kang ◽  
...  
Keyword(s):  
Leakage Current ◽  
Random Telegraph Noise ◽  
Telegraph Noise ◽  
Oxide Trap
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