scholarly journals On-Chip Characterization of Single-Event Transient Pulsewidths

2006 ◽  
Vol 6 (4) ◽  
pp. 542-549 ◽  
Author(s):  
Balaji Narasimham ◽  
Vishwa Ramachandran ◽  
Bharat L. Bhuva ◽  
Ronald D. Schrimpf ◽  
Arthur F. Witulski ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Transient ◽  
On Chip

Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

2002 ◽  
Vol 49 (3) ◽  
pp. 1502-1508 ◽  
Author(s):  
S. Buchner ◽  
D. McMorrow ◽  
A. Sternberg ◽  
L. Massengill ◽  
R.L. Pease ◽  
...  
Keyword(s):  
Model Validation ◽  
Pulsed Laser ◽  
Single Event ◽  
Single Event Transient ◽  
Voltage Comparator

Improved on-chip self-triggered single-event transient measurement circuit design and applications

2017 ◽  
Vol 71 ◽  
pp. 99-105 ◽  
Author(s):  
Rongmei Chen ◽  
Wei Chen ◽  
Xiaoqiang Guo ◽  
Chen Shen ◽  
Fengqi Zhang ◽  
...  
Keyword(s):  
Circuit Design ◽  
Single Event ◽  
Measurement Circuit ◽  
Single Event Transient ◽  
On Chip ◽  
Transient Measurement

Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha Irradiation

2013 ◽  
Vol 60 (4) ◽  
pp. 2640-2646 ◽  
Author(s):  
Michael Hofbauer ◽  
Kurt Schweiger ◽  
Horst Zimmermann ◽  
Ulrich Giesen ◽  
Frank Langner ◽  
...  
Keyword(s):  
Pulse Shape ◽  
Supply Voltage ◽  
Single Event ◽  
Single Event Transient ◽  
Voltage Dependent ◽  
On Chip ◽  
Alpha Irradiation

Single-Event Transient Characterization of a Radiation-Tolerant Charge-Pump Phase-Locked Loop Fabricated in 130 nm PD-SOI Technology

2016 ◽  
Vol 63 (4) ◽  
pp. 2402-2408 ◽  
Author(s):  
Zhuojun Chen ◽  
Min Lin ◽  
Yunlong Zheng ◽  
Zuodong Wei ◽  
Shuigen Huang ◽  
...  
Keyword(s):  
Charge Pump ◽  
Phase Locked Loop ◽  
Single Event ◽  
Single Event Transient ◽  
Radiation Tolerant ◽  
Soi Technology

Single-Event Transient Error Characterization of a Radiation-Hardened by Design 90 nm SerDes Transmitter Driver

2009 ◽  
Vol 56 (6) ◽  
pp. 3463-3468 ◽  
Author(s):  
S. E. Armstrong ◽  
B. D. Olson ◽  
J. Popp ◽  
J. Braatz ◽  
T. D. Loveless ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Transient ◽  
Error Characterization ◽  
Radiation Hardened ◽  
Transient Error ◽  
Radiation Hardened By Design

scholarly journals Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

2019 ◽  
Vol 16 (8) ◽  
pp. 20190141-20190141 ◽  
Author(s):  
Ruiqiang Song ◽  
Jinjin Shao ◽  
Bin Liang ◽  
Yaqing Chi ◽  
Jianjun Chen
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Single Event Transient
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