Static test compaction for full-scan circuits based on combinational test sets and nonscan input sequences and a lower bound on the number of tests

2004 ◽  
Vol 53 (12) ◽  
pp. 1569-1581 ◽  
Author(s):  
I. Pomeranz ◽  
S.M. Reddy
Keyword(s):  
Lower Bound ◽  
Static Test ◽  
Test Compaction ◽  
Full Scan ◽  
Test Sets ◽  
Scan Circuits

Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence Characterization

2005 ◽  
Vol 54 (5) ◽  
pp. 1662-1677 ◽  
Author(s):  
S.R. Das ◽  
C.V. Ramamoorthy ◽  
M.H. Assaf ◽  
E.M. Petriu ◽  
W.-B. Jone ◽  
...  
Keyword(s):  
Sequence Characterization ◽  
Full Scan ◽  
Test Sets ◽  
Scan Circuits
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