Quantitative analysis of electron traps in annealed semi-insulating gallium arsenide epitaxial layers grown by molecular beam epitaxy at low temperature with a novel zero quiescent bias voltage transient current spectroscopy technique
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1993 ◽
Vol 32
(Part 2, No. 9A)
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pp. L1192-L1195
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1996 ◽
Vol 14
(3)
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pp. 2278
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1991 ◽
Vol 30
(Part 2, No. 11A)
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pp. L1843-L1846
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