A study of SONOS charge loss mechanism after hot-hole stressing using trap-layer engineering and electrical re-fill methods

2008 ◽  
Author(s):  
Yi-Hsuan Hsiao ◽  
Hang-Ting Lue ◽  
M. Y. Lee ◽  
Shih-Chieh Huang ◽  
Tsung-Yi Chou ◽  
...  
Keyword(s):  
Loss Mechanism ◽  
Charge Loss

Charge loss mechanism of non-volatile V3Si nano-particles memory device

2012 ◽  
Vol 101 (23) ◽  
pp. 233510 ◽  
Author(s):  
Dongwook Kim ◽  
Dong Uk Lee ◽  
Eun Kyu Kim ◽  
Won-Ju Cho
Keyword(s):  
Memory Device ◽  
Nano Particles ◽  
Loss Mechanism ◽  
Charge Loss

Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy

2013 ◽  
Vol 34 (7) ◽  
pp. 870-872 ◽  
Author(s):  
Yulong Han ◽  
Zongliang Huo ◽  
Xinkai Li ◽  
Guoxing Chen ◽  
Xiaonan Yang ◽  
...  
Keyword(s):  
Variable Temperature ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Loss Mechanism ◽  
Force Microscopy ◽  
Charge Loss

The investigation of charge loss mechanism in a two-bit wrapped-gate nitride storage nonvolatile memory

2010 ◽  
Vol 97 (18) ◽  
pp. 183508 ◽  
Author(s):  
Y. H. Ho ◽  
Steve S. Chung ◽  
H. H. Chen
Keyword(s):  
Nonvolatile Memory ◽  
Loss Mechanism ◽  
Charge Loss

Reliability issues related to Fast Charge Loss Mechanism in Embedded Non Volatile Memories

2006 ◽  
Author(s):  
Pascal Mora ◽  
Sophie Renard ◽  
Germain Bossu ◽  
Patrice Waltz ◽  
George Pananakakis ◽  
...  
Keyword(s):  
Loss Mechanism ◽  
Fast Charge ◽  
Charge Loss

Modelling of initial fast charge loss mechanism for logic embedded non-volatile memories

2017 ◽  
Vol 76-77 ◽  
pp. 174-177 ◽  
Author(s):  
J. Wu ◽  
C. Li ◽  
H. Wang ◽  
J. Li ◽  
L. Zheng
Keyword(s):  
Loss Mechanism ◽  
Fast Charge ◽  
Charge Loss

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

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