Reliability issues related to Fast Charge Loss Mechanism in Embedded Non Volatile Memories

Author(s):  
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Sophie Renard ◽  
Germain Bossu ◽  
Patrice Waltz ◽  
George Pananakakis ◽  
...  
2017 ◽  
Vol 76-77 ◽  
pp. 174-177 ◽  
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C. Li ◽  
H. Wang ◽  
J. Li ◽  
L. Zheng

2012 ◽  
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pp. 233510 ◽  
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Dongwook Kim ◽  
Dong Uk Lee ◽  
Eun Kyu Kim ◽  
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Vol 34 (7) ◽  
pp. 870-872 ◽  
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pp. 183508 ◽  
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1998 ◽  
Vol 37 (Part 1, No. 8) ◽  
pp. 4306-4310 ◽  
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