Impact of Bottom Interfacial Layer on the Threshold Voltage and Device Reliability of Fluorine Incorporated PMOSFETS with High-K/Metal Gate

Author(s):  
Kisik Choi ◽  
Taeho Lee ◽  
Joel Barnett ◽  
Harlan R. Harris ◽  
Seungsoo Kweon ◽  
...  
2021 ◽  
Author(s):  
Rishu Chaujar ◽  
Mekonnen Getnet Yirak

Abstract In this work, junctionless double and triple metal gate high-k gate all around nanowire field-effect transistor-based APTES biosensor has been developed to study the impact of ITCs on device sensitivity. The analytical results were authenticated using ‘‘ATLAS-3D’’ device simulation tool. Effect of different interface trap charge on the output characteristics of double and triple metal gate high-k gate all around junctionless NWFET biosensor was studied. Output characteristics, like transconductance, output conductance,drain current, threshold voltage, subthreshold voltage and switching ratio, including APTES biomolecule, have been studied in both devices. 184% improvement has been investigated in shifting threshold voltage in a triple metal gate compared to a double metal gate when APTES biomolecule immobilizes on the nanogap cavity region under negative ITCs. Based on this finding, drain off-current ratio and shifting threshold voltage were considered as sensing metrics when APTES biomolecule immobilizes in the nanogap cavity under negative ITCs which is significant for Alzheimer's disease detection. We signifies a negative ITC has a positive impact on our proposed biosensor device compared to positive and neutral ITCs.


2020 ◽  
Vol 223 ◽  
pp. 111219 ◽  
Author(s):  
S. Siddiqui ◽  
R. Galatage ◽  
W. Zhao ◽  
G. Raja Muthinti ◽  
J. Fronheiser ◽  
...  

2008 ◽  
Vol 92 (9) ◽  
pp. 092901 ◽  
Author(s):  
P. D. Kirsch ◽  
P. Sivasubramani ◽  
J. Huang ◽  
C. D. Young ◽  
M. A. Quevedo-Lopez ◽  
...  

2015 ◽  
Vol 108 ◽  
pp. 24-29 ◽  
Author(s):  
E. Dentoni Litta ◽  
P.-E. Hellström ◽  
M. Östling

2013 ◽  
Vol 60 (10) ◽  
pp. 3271-3276 ◽  
Author(s):  
Eugenio Dentoni Litta ◽  
Per-Erik Hellstrom ◽  
Christoph Henkel ◽  
Mikael Ostling

2012 ◽  
Author(s):  
K. V. Rao ◽  
T. Ngai ◽  
C. Hobbs ◽  
M. Rodgers ◽  
S. Vivekanand ◽  
...  

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