Evaluation of STI degradation causing DRAM standby current failure in burn-in mode operation using a carrier injection method
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2017 ◽
Vol 70
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pp. 265-271
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2001 ◽
Vol 11
(PR11)
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pp. Pr11-53-Pr11-57
2019 ◽
Vol 139
(9)
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pp. 824-831
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