Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults

2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2011.15 ◽

2011 ◽

Cited By ~ 7

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Transition Faults ◽

Test Sets

Download Full-text

Low-Power Diagnostic Test Sets for Transition Faults Based on Functional Broadside Tests

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2290768 ◽

2014 ◽

Vol 22 (11) ◽

pp. 2427-2431 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

Keyword(s):

Low Power ◽

Diagnostic Test ◽

Transition Faults ◽

Test Sets

Download Full-text

Diagnostic Test Sets with Increased Switching Activity for Transition Faults

Journal of Low Power Electronics ◽

10.1166/jolpe.2013.1248 ◽

2013 ◽

Vol 9 (1) ◽

pp. 133-140

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Switching Activity ◽

Transition Faults ◽

Test Sets

Download Full-text

Static test compaction for diagnostic test sets of full-scan circuits

IET Computers & Digital Techniques ◽

10.1049/iet-cdt.2009.0110 ◽

2010 ◽

Vol 4 (5) ◽

pp. 365-373 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Static Test ◽

Test Compaction ◽

Full Scan ◽

Test Sets ◽

Scan Circuits

Download Full-text

On n-detection test sets and variable n-detection test sets for transition faults

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) ◽

10.1109/vtest.1999.766662 ◽

2003 ◽

Cited By ~ 44

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Transition Faults ◽

Test Sets

Download Full-text

GA based diagnostic test pattern generation for transition faults

2015 19th International Symposium on VLSI Design and Test ◽

10.1109/isvdat.2015.7208122 ◽

2015 ◽

Cited By ~ 2

Author(s):

Anupam Bhar ◽

Santanu Chattopadhyay ◽

Indranil Sengupta ◽

Rohit Kapur

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Transition Faults

Download Full-text

Diagnostic test generation for transition faults using a stuck-at ATPG tool

2009 International Test Conference ◽

10.1109/test.2009.5355681 ◽

2009 ◽

Cited By ~ 16

Author(s):

Yoshinobu Higami ◽

Yosuke Kurose ◽

Satoshi Ohno ◽

Hironori Yamaoka ◽

Hiroshi Takahashi ◽

...

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Transition Faults

Download Full-text

Using fault sampling to compute I/sub DDQ/ diagnostic test sets

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) ◽

10.1109/vtest.1997.599444 ◽

2002 ◽

Author(s):

Yiming Gong ◽

S. Chakravarty

Keyword(s):

Diagnostic Test ◽

Test Sets

Download Full-text

A Method of Diagnostic Test Generation for Transition Faults

2015 IEEE 21st Pacific Rim International Symposium on Dependable Computing (PRDC) ◽

10.1109/prdc.2015.47 ◽

2015 ◽

Author(s):

Renji Ono ◽

Satoshi Ohtake

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Transition Faults

Download Full-text

A METHOD OF SYNTHESIZING IRREDUNDANT CIRCUITS, ADMITTING SMALL SINGLE FAULT DIAGNOSTIC TEST SETS AT STUCK-AT FAULTS AT OUTPUTS OF GATES

University proceedings Volga region Physical and mathematical sciences ◽

10.21685/2072-3040-2016-2-8 ◽

2016 ◽

Author(s):

D.S. Romanov ◽

◽

E.Y. Romanova ◽

Keyword(s):

Diagnostic Test ◽

Single Fault ◽

Test Sets ◽

Fault Diagnostic

Download Full-text

The cut delay fault model for guiding the generation of n-detection test sets for transition faults

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) ◽

10.1109/vlsid.2006.160 ◽

2006 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Fault Model ◽

Delay Fault ◽

Transition Faults ◽

Test Sets

Download Full-text