Diagnostic test generation for transition faults using a stuck-at ATPG tool

2009 International Test Conference ◽

10.1109/test.2009.5355681 ◽

2009 ◽

Cited By ~ 16

Author(s):

Yoshinobu Higami ◽

Yosuke Kurose ◽

Satoshi Ohno ◽

Hironori Yamaoka ◽

Hiroshi Takahashi ◽

...

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Transition Faults

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A Method of Diagnostic Test Generation for Transition Faults

2015 IEEE 21st Pacific Rim International Symposium on Dependable Computing (PRDC) ◽

10.1109/prdc.2015.47 ◽

2015 ◽

Author(s):

Renji Ono ◽

Satoshi Ohtake

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Transition Faults

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On diagnosis and diagnostic test generation for pattern-dependent transition faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.924832 ◽

2001 ◽

Vol 20 (6) ◽

pp. 791-800 ◽

Cited By ~ 8

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Transition Faults

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Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation

Journal of Electronic Testing ◽

10.1007/s10836-010-5142-2 ◽

2010 ◽

Vol 26 (2) ◽

pp. 165-176 ◽

Cited By ~ 8

Author(s):

Maheshwar Chandrasekar ◽

Nikhil P. Rahagude ◽

Michael S. Hsiao

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Incremental Learning ◽

Learning Framework

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Diagnostic Test Generation for Arbitrary Faults

2006 IEEE International Test Conference ◽

10.1109/test.2006.297647 ◽

2006 ◽

Cited By ~ 14

Author(s):

Naresh Bhatti ◽

R.D. Blanton

Keyword(s):

Diagnostic Test ◽

Test Generation

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Test Generation for Timing-Critical Transition Faults

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388063 ◽

2007 ◽

Author(s):

Xijiang Lin ◽

Mark Kassab ◽

Janusz Rajski

Keyword(s):

Test Generation ◽

Critical Transition ◽

Transition Faults

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A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.845083 ◽

2000 ◽

Vol 19 (5) ◽

pp. 589-600 ◽

Cited By ~ 20

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Generation Procedure

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Low-Power Diagnostic Test Sets for Transition Faults Based on Functional Broadside Tests

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2290768 ◽

2014 ◽

Vol 22 (11) ◽

pp. 2427-2431 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

Keyword(s):

Low Power ◽

Diagnostic Test ◽

Transition Faults ◽

Test Sets

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Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults

2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2011.15 ◽

2011 ◽

Cited By ~ 7

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Transition Faults ◽

Test Sets

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Diagnostic Test Sets with Increased Switching Activity for Transition Faults

Journal of Low Power Electronics ◽

10.1166/jolpe.2013.1248 ◽

2013 ◽

Vol 9 (1) ◽

pp. 133-140

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Switching Activity ◽

Transition Faults ◽

Test Sets

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Output-Dependent Diagnostic Test Generation

2010 23rd International Conference on VLSI Design ◽

10.1109/vlsi.design.2010.13 ◽

2010 ◽

Cited By ~ 11

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation

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