Using fault sampling to compute I/sub DDQ/ diagnostic test sets

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) ◽

10.1109/vtest.1997.599444 ◽

2002 ◽

Author(s):

Yiming Gong ◽

S. Chakravarty

Keyword(s):

Diagnostic Test ◽

Test Sets

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Low-Power Diagnostic Test Sets for Transition Faults Based on Functional Broadside Tests

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2290768 ◽

2014 ◽

Vol 22 (11) ◽

pp. 2427-2431 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

Keyword(s):

Low Power ◽

Diagnostic Test ◽

Transition Faults ◽

Test Sets

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Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults

2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2011.15 ◽

2011 ◽

Cited By ~ 7

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Transition Faults ◽

Test Sets

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Diagnostic Test Sets with Increased Switching Activity for Transition Faults

Journal of Low Power Electronics ◽

10.1166/jolpe.2013.1248 ◽

2013 ◽

Vol 9 (1) ◽

pp. 133-140

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Switching Activity ◽

Transition Faults ◽

Test Sets

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Static test compaction for diagnostic test sets of full-scan circuits

IET Computers & Digital Techniques ◽

10.1049/iet-cdt.2009.0110 ◽

2010 ◽

Vol 4 (5) ◽

pp. 365-373 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Static Test ◽

Test Compaction ◽

Full Scan ◽

Test Sets ◽

Scan Circuits

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A METHOD OF SYNTHESIZING IRREDUNDANT CIRCUITS, ADMITTING SMALL SINGLE FAULT DIAGNOSTIC TEST SETS AT STUCK-AT FAULTS AT OUTPUTS OF GATES

University proceedings Volga region Physical and mathematical sciences ◽

10.21685/2072-3040-2016-2-8 ◽

2016 ◽

Author(s):

D.S. Romanov ◽

◽

E.Y. Romanova ◽

Keyword(s):

Diagnostic Test ◽

Single Fault ◽

Test Sets ◽

Fault Diagnostic

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A METHOD OF SYNTHESIS OF IRREDUNDANT CIRCUITS (IN A STANDARD BASIS) ADMITTING SINGLE FAULT DIAGNOSTIC TEST SETS WITH CARDINALITY 2

University proceedings Volga region Physical and mathematical sciences ◽

10.21685/2072-3040-2016-3-4 ◽

2016 ◽

Author(s):

D.S. Romanov ◽

Keyword(s):

Diagnostic Test ◽

Standard Basis ◽

Single Fault ◽

Test Sets ◽

Fault Diagnostic

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Generation of compact multi-cycle diagnostic test sets

2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2013.6569382 ◽

2013 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Test Sets

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THE ROLE OF HIPPURAN RENOGRAPHY AS A DIAGNOSTIC TEST TO DETERMINE TRANSIENT ACUTE RENAL FAILURE (ARF) EVENTS IN NEPHROTIC SYNDROME (NS) PATIENTS

Nephrology ◽

10.1046/j.1440-1797.2002.00007-1-154.x ◽

2002 ◽

Vol 7 (1) ◽

pp. A154-A154

Author(s):

E. Sukandar ◽

R. Bandiara

Keyword(s):

Renal Failure ◽

Acute Renal Failure ◽

Nephrotic Syndrome ◽

Diagnostic Test

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Feline toxoplasmosis: Interpretation of diagnostic test results

Seminars in Veterinary Medicine and Surgery Small Animal ◽

10.1016/s1096-2867(96)80027-2 ◽

1996 ◽

Vol 11 (3) ◽

pp. 154-160 ◽

Cited By ~ 29

Author(s):

Michael R. Lappin

Keyword(s):

Diagnostic Test ◽

Test Results

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Abstract #862529: Development and Validation of a Molecular Diagnostic Test for Medullary Thyroid Carcinoma Using NGS Mutation Detection and Microrna Expression Profiling

Endocrine Practice ◽

10.1016/s1530-891x(20)39869-4 ◽

2020 ◽

Vol 26 ◽

pp. 310-311

Author(s):

Gyanendra Kumar

Keyword(s):

Thyroid Carcinoma ◽

Medullary Thyroid Carcinoma ◽

Diagnostic Test ◽

Expression Profiling ◽

Mutation Detection ◽

Microrna Expression ◽

Molecular Diagnostic ◽

Medullary Thyroid ◽

Development And Validation ◽

Molecular Diagnostic Test

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