Reliability assessment of thin gate oxides with a low level leakage current induced by plasma damage

2002 ◽  
Author(s):  
S.U. Kim
Keyword(s):  
Leakage Current ◽  
Reliability Assessment ◽  
Plasma Damage ◽  
Gate Oxides ◽  
Low Level

Logistic model for leakage current in electrical stressed ultra-thin gate oxides

2003 ◽  
Vol 39 (9) ◽  
pp. 749 ◽  
Author(s):  
E. Miranda ◽  
A. Cester ◽  
A. Paccagnella
Keyword(s):  
Leakage Current ◽  
Logistic Model ◽  
Gate Oxides

Reliability assessment on automobile suspension system using wavelet analysis

2019 ◽  
Vol 10 (5) ◽  
pp. 602-611
Author(s):  
Airee Afiq Abd Rahim ◽  
Shahrum Abdullah ◽  
Salvinder Singh Karam Singh ◽  
Mohd. Zaki Nuawi
Keyword(s):  
Fatigue Life ◽  
Wavelet Decomposition ◽  
Reliability Assessment ◽  
Content Type ◽  
Low Level ◽  
Rural Road ◽  
Automobile Suspension ◽  
Life Analysis ◽  
Fatigue Life Analysis ◽  
High Level

Purpose The purpose of this paper is to focus on the reliability assessment on the basis of automobile suspension fatigue life using wavelet decomposition method. Design/methodology/approach The discrete wavelet transform (DWT) of automobile coil spring signal is implemented as a response to different road surfaces. A reliability analysis is applied to determine the potential of the wavelet implementation in fatigue life analysis. The signals used in this study are highway and rural road. Findings On the basis of the implementation of wavelet decomposition method, low-level decomposition replicates the original signals in comparison with high-level decomposition. The fatigue life of low-level decomposition lies in the 2:1 and 1:2 correlation graph. The percentage difference for mean cycle to failure presents low values for low-level decomposition, with 44.31 per cent for highway and 44.20 per cent for rural road. The percentage of difference for high-level decomposition is high. Originality/value The determination of fatigue life analysis by using the DWT method is suitable for low-level decomposition. High-level decomposition is considered noise that cannot be eliminated and does not contribute to the failure of the structure.

Effects of nitridation by nitric oxide on the leakage current of thin SiO2 gate oxides

2000 ◽  
Vol 87 (1) ◽  
pp. 498-501 ◽  
Author(s):  
C. Gerardi ◽  
M. Melanotte ◽  
S. Lombardo ◽  
M. Alessandri ◽  
B. Crivelli ◽  
...  
Keyword(s):  
Nitric Oxide ◽  
Leakage Current ◽  
Gate Oxides

Stress induced leakage current in ultra-thin gate oxides after constant current stress

1997 ◽  
Vol 36 (1-4) ◽  
pp. 145-148 ◽  
Author(s):  
A. Scarpa ◽  
G. Ghibaudo ◽  
G. Ghidini ◽  
G. Pananakakis ◽  
A. Paccagnella
Keyword(s):  
Leakage Current ◽  
Constant Current ◽  
Gate Oxides ◽  
Current Stress ◽  
Stress Induced Leakage Current
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