Millisecond Positive Bias Recovery of Negative Bias Illumination Stressed Amorphous InGaZnO Thin-Film Transistors

2017 ◽  
Vol 38 (4) ◽  
pp. 477-480 ◽  
Author(s):  
Mohammad Masum Billah ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Positive Bias ◽  
Amorphous Ingazno

Abnormal Negative Bias Stress Instability of Amorphous InGaZnO Thin Film Transistors

2020 ◽  
Vol MA2020-02 (28) ◽  
pp. 1918-1918
Author(s):  
Chia-Chun Yen ◽  
Chieh Lo ◽  
Yu-Chieh Liu ◽  
Chun-Hung Yeh ◽  
Cheewee Liu
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Bias Stress ◽  
Amorphous Ingazno

Quantitative Analysis of Negative Bias Illumination Stress-Induced Instability Mechanisms in Amorphous InGaZnO Thin-Film Transistors

2011 ◽  
Vol 59 (2(1)) ◽  
pp. 474-477 ◽  
Author(s):  
Yongsik Kim ◽  
Min-Kyung Bae ◽  
Dongsik Kong ◽  
Hyun Kwnag Jung ◽  
Jeahyeong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Amorphous Ingazno ◽  
Negative Bias Illumination Stress

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

2012 ◽  
Vol 33 (1) ◽  
pp. 62-64 ◽  
Author(s):  
Sungchul Kim ◽  
Yong Woo Jeon ◽  
Yongsik Kim ◽  
Dongsik Kong ◽  
Hyun Kwang Jung ◽  
...  
Keyword(s):  
Thin Film ◽  
Flow Rate ◽  
Thin Film Transistors ◽  
Oxygen Flow Rate ◽  
Oxygen Flow ◽  
Positive Bias ◽  
Amorphous Ingazno
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