Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

2014 ◽  
Vol 35 (12) ◽  
pp. 1260-1262 ◽  
Author(s):  
Young-Joon Han ◽  
Yong-Jin Choi ◽  
In-Tak Cho ◽  
Sung Hun Jin ◽  
Jong-Ho Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Passivation Layer ◽  
Bias Stress ◽  
P Type

Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors

2019 ◽  
Vol 28 (8) ◽  
pp. 088502
Author(s):  
Chao-Yang Han ◽  
Yuan Liu ◽  
Yu-Rong Liu ◽  
Ya-Yi Chen ◽  
Li Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Gate Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Noise Characteristics ◽  
P Type ◽  
Si Thin Film

Bias-Stress-Induced Instabilities in P-Type ${\rm Cu}_{2}{\rm O}$ Thin-Film Transistors

2013 ◽  
Vol 34 (5) ◽  
pp. 647-649 ◽  
Author(s):  
Ick-Joon Park ◽  
Chan-Yong Jeong ◽  
Myeonghun U ◽  
Sang-Hun Song ◽  
In-Tak Cho ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Bias Stress ◽  
P Type

Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

2015 ◽  
Vol 36 (5) ◽  
pp. 466-468 ◽  
Author(s):  
Young-Joon Han ◽  
Yong-Jin Choi ◽  
Chan-Yong Jeong ◽  
Daeun Lee ◽  
Sang-Hun Song ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Bias Stress ◽  
P Type

Improvement in bias-stress and long-term stabilities for in-Ga-Zn-O thin-film transistors using solution-process-compatible polymeric gate insulator

2019 ◽  
Vol 71 ◽  
pp. 7-13 ◽  
Author(s):  
Sol-Mi Kwak ◽  
Hyeong-Rae Kim ◽  
Hye-Won Jang ◽  
Ji-Hee Yang ◽  
Furuta Mamoru ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Solution Process ◽  
Gate Insulator ◽  
Bias Stress

Reliability of Al2O3/In-Si-O-C Thin-Film Transistors with an Al2O3 Passivation Layer under Gate-Bias Stress

2018 ◽  
Vol 86 (11) ◽  
pp. 135-145 ◽  
Author(s):  
Kazunori Kurishima ◽  
Toshihide Nabatame ◽  
Takashi Onaya ◽  
Kazuhito Tsukagoshi ◽  
Akihiko Ohi ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Passivation Layer ◽  
Gate Bias ◽  
Bias Stress ◽  
Gate Bias Stress
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