Temperature dependence of hot-carrier-induced degradation in 0.1 μm SOI nMOSFETs with thin oxide

2002 ◽  
Vol 23 (7) ◽  
pp. 425-427 ◽  
Author(s):  
Wen-Kuan Yeh ◽  
Wen-Han Wang ◽  
Yean-Kuen Fang ◽  
Fu-Liang Yang
Keyword(s):  
Temperature Dependence ◽  
Hot Carrier ◽  
Thin Oxide

Hot-Carrier-induced Degradation on 0.1μm Partially Depleted SOI CMOSFET with thin Oxide

2002 ◽  
Author(s):  
Wen-Kuan Yeh ◽  
Wen-Han Wang ◽  
Yean-Kuen Fang ◽  
Fu-Liang Yang
Keyword(s):  
Hot Carrier ◽  
Thin Oxide

A simple technique for hot-carrier-induced interface state analysis in thin oxide MOS capacitors

1999 ◽  
Vol 43 (3) ◽  
pp. 641-644 ◽  
Author(s):  
A. Koukab ◽  
A. Hoffmann ◽  
A. Bath ◽  
J.-P. Charles
Keyword(s):  
Simple Technique ◽  
Interface State ◽  
Mos Capacitors ◽  
Hot Carrier ◽  
Thin Oxide ◽  
State Analysis

Temperature dependence of thin oxide film growth on Fe(110)

1993 ◽  
Vol 287-288 ◽  
pp. 245-249 ◽  
Author(s):  
G.W.R. Leibbrandt ◽  
L.H. Spiekman ◽  
F.H.P.M. Habraken
Keyword(s):  
Oxide Film ◽  
Temperature Dependence ◽  
Film Growth ◽  
Thin Oxide Film ◽  
Thin Oxide

Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

2003 ◽  
Author(s):  
Yao-Jen Lee ◽  
Tien-Sheng Chao ◽  
Chun-Yang Huang ◽  
Horng-Chih Lin ◽  
Tiao-Yuan Huang
Keyword(s):  
Temperature Dependence ◽  
Threshold Voltage ◽  
Dynamic Threshold ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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