Comparison of electrical and reliability characteristics of different 14 /spl Aring/ oxynitride gate dielectrics

2002 ◽  
Vol 23 (7) ◽  
pp. 416-418 ◽  
Author(s):  
Tung-Ming Pan ◽  
Hsiu-Shan Lin ◽  
Main-Gwo Chen ◽  
Chuan-Hsi Liu ◽  
Yih-Jau Chang
Keyword(s):  
Gate Dielectrics ◽  
Reliability Characteristics

Scalability and Reliability Characteristics of CVD HfO[sub 2] Gate Dielectrics with HfN Electrodes for Advanced CMOS Applications

2007 ◽  
Vol 154 (11) ◽  
pp. H927 ◽  
Author(s):  
J. F. Kang ◽  
H. Y. Yu ◽  
C. Ren ◽  
N. Sa ◽  
H. Yang ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Reliability Characteristics

Physical and reliability characteristics of Hf-based gate dielectrics on strained-Si/sub 1-x/Ge/sub x/ MOS devices

2005 ◽  
Vol 5 (2) ◽  
pp. 168-176 ◽  
Author(s):  
Pei-Jer Tzeng ◽  
S. Maikap ◽  
Peng-Shiu Chen ◽  
Yu-Wei Chou ◽  
Chieh-Shuo Liang ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Strained Si ◽  
Mos Devices ◽  
Reliability Characteristics

EVALUATION OF THE RELIABILITY OF COMPLEX TECHNICAL RECONFIGURATION SYSTEMS BY STATISTICAL MODELING METHOD

2019 ◽  
pp. 84-88
Author(s):  
A.Yu. Kulakov
Keyword(s):  
Normal Distribution ◽  
Statistical Modeling ◽  
Quantitative Estimate ◽  
Failure Time ◽  
Modeling Method ◽  
System Failure ◽  
Similar System ◽  
Orbit Control ◽  
Reliability Characteristics ◽  
Complex Technical System

Goal. Assess the reliability of a complex technical system with periodic reconfiguration and compare the results obtained a similar system, but without reconfiguration. Materials and methods. In this article uses the method of statistical modeling (Monte Carlo) to assess the reliability of complex system. We using the normal and exponential distribution of failure time for modeling failures of system elements. Reconfiguration algorithm is the algorithm proposed for the attitude and orbit control system of spacecraft. Results. A computer program has been developed for assessing reliability on the basis of a statistical modeling method, which makes it possible to evaluate systems of varying complexity with exponential and normal distribution, as well as with and without periodic reconfiguration. A quantitative estimate of the reliability as a function of the probability of system failure is obtained. Conclusion. It has been demonstrated that a system with reconfiguration has the best reliability characteristics, both in the case of exponential and normal distribution of failures.

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