A comparative study of wire bonding versus solder bumping of power semiconductor devices

IWIPP 2000. International Workshop on Integrated Power Packaging (Cat. No.00EX426) ◽

10.1109/iwipp.2000.885185 ◽

2002 ◽

Cited By ~ 1

Author(s):

Xingsheng Liu ◽

Xiukuan Jing ◽

Guo-Quan Lu

Keyword(s):

Comparative Study ◽

Semiconductor Devices ◽

Wire Bonding ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Comparative Study of Power Semiconductor Devices Using Saber-Simulink Co-simulation

2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) ◽

10.1109/wipda46397.2019.8998900 ◽

2019 ◽

Cited By ~ 1

Author(s):

Kenneth Mordi ◽

Md Maksudul Hossain ◽

Dereje Woldegiorgis ◽

Haider Mhiesan ◽

Alan Mantooth

Keyword(s):

Comparative Study ◽

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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A Comparative Study on Converter-Level On-State Voltage Measurement Circuits for Power Semiconductor Devices

10.1109/ecce47101.2021.9595088 ◽

2021 ◽

Author(s):

Yingzhou Peng ◽

Huai Wang

Keyword(s):

Comparative Study ◽

Semiconductor Devices ◽

Voltage Measurement ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Preface to the Special Issue on ^|^ldquo;Current Technologies and Applications on Power Semiconductor Devices ^|^mdash;Silicon and Wide Bandgap Semiconductors^|^mdash;^|^rdquo;

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.130.911 ◽

2010 ◽

Vol 130 (6) ◽

pp. 911-911

Author(s):

Mutsuhiro Mori

Keyword(s):

Semiconductor Devices ◽

Wide Bandgap ◽

Special Issue ◽

Wide Bandgap Semiconductors ◽

Power Semiconductor ◽

Power Semiconductor Devices ◽

Bandgap Semiconductors

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Residual Voids in Degassing Process of Encapsulation Gel for Power Semiconductor Devices

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms.134.432 ◽

2014 ◽

Vol 134 (6) ◽

pp. 432-433

Author(s):

Masahiro Sato ◽

Akiko Kumada ◽

Kunihiko Hidaka ◽

Keisuke Yamashiro ◽

Yuji Hayase ◽

...

Keyword(s):

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Introduction: Applications Roadmap of GaN Power Semiconductor Devices

The Journal of the Institute of Electrical Engineers of Japan ◽

10.1541/ieejjournal.139.76 ◽

2019 ◽

Vol 139 (2) ◽

pp. 76-79

Author(s):

Masayoshi YAMAMOTO

Keyword(s):

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Laser synthesized silicon carbide power semiconductor devices

International Congress on Applications of Lasers & Electro-Optics ◽

10.2351/1.5059204 ◽

1998 ◽

Author(s):

Nathaniel R. Quick

Keyword(s):

Silicon Carbide ◽

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Junction Temperature Control Strategy for Lifetime Extension of Power Semiconductor Devices

2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe) ◽

10.23919/epe20ecceeurope43536.2020.9215718 ◽

2020 ◽

Author(s):

Johannes Ruthardt ◽

Hendrik Schulte ◽

Philipp Ziegler ◽

Manuel Fischer ◽

Maximilian Nitzsche ◽

...

Keyword(s):

Temperature Control ◽

Control Strategy ◽

Semiconductor Devices ◽

Junction Temperature ◽

Power Semiconductor ◽

Power Semiconductor Devices ◽

Lifetime Extension

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Fusible Link Technology for Power Semiconductor Devices

10.21236/ada244110 ◽

1991 ◽

Author(s):

Prasad Venkatraman ◽

B. J. Baliga

Keyword(s):

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Room Temperature Bonding of GaN on Diamond Wafers by Using Mo/Au Nano-Layer for High-Power Semiconductor Devices

SSRN Electronic Journal ◽

10.2139/ssrn.3427489 ◽

2019 ◽

Author(s):

Kang Wang ◽

Kun Ruan ◽

Wenbo Hu ◽

Shengli Wu ◽

Hongxing Wang

Keyword(s):

High Power ◽

Room Temperature ◽

Semiconductor Devices ◽

Power Semiconductor ◽

Power Semiconductor Devices

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Investigation of power semiconductor devices under applying voltage by multi-purpose scanning probe microscope

2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) ◽

10.1109/wipdaasia49671.2020.9360252 ◽

2020 ◽

Author(s):

Nobuo SATOH ◽

Atsushi DOI ◽

Hidekazu YAMAMOTO

Keyword(s):

Semiconductor Devices ◽

Scanning Probe Microscope ◽

Scanning Probe ◽

Power Semiconductor ◽

Power Semiconductor Devices ◽

Probe Microscope

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