Question marks to the extrapolation to lower temperatures in high temperature storage life (HTSL) testing in plastic encapsulated IC'S

1996 ◽  
Author(s):  
W. Schuddeboom ◽  
M. Wubbenhorst
Keyword(s):  
High Temperature ◽  
Storage Life ◽  
High Temperature Storage ◽  
Temperature Storage

A mechanism of threshold voltage changes for WNx gate GaAs MESFETs in high temperature storage life tests

1995 ◽  
Vol 35 (12) ◽  
pp. 1515-1520 ◽  
Author(s):  
Y. Kitaura ◽  
K. Ishida ◽  
T. Mizoguchi ◽  
N. Uchitomi ◽  
T. Matsunaga ◽  
...  
Keyword(s):  
High Temperature ◽  
Threshold Voltage ◽  
Storage Life ◽  
High Temperature Storage ◽  
Life Tests ◽  
Temperature Storage

Copper wire interconnect reliability evaluation using in-situ High Temperature Storage Life (HTSL) tests

2014 ◽  
Vol 54 (9-10) ◽  
pp. 1661-1665 ◽  
Author(s):  
A. Mavinkurve ◽  
L. Goumans ◽  
G.M. O’Halloran ◽  
R.T.H. Rongen ◽  
M.-L. Farrugia
Keyword(s):  
High Temperature ◽  
Copper Wire ◽  
Reliability Evaluation ◽  
Storage Life ◽  
High Temperature Storage ◽  
Interconnect Reliability ◽  
Temperature Storage
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