Electrical test method and realized system for high pin count components during reliability tests

2012 ◽  
Author(s):  
O. Albrecht ◽  
A. Klemm ◽  
M. Oppermann ◽  
K. Wolter
Keyword(s):  
Test Method ◽  
Electrical Test

An electrical test method for quality detecting of wafer level eutectic bonding

2016 ◽  
Vol 27 (1) ◽  
pp. 015028 ◽  
Author(s):  
Lemin Zhang ◽  
Binbin Jiao ◽  
Will Ku ◽  
Li-Tien Tseng ◽  
Yanmei Kong ◽  
...  
Keyword(s):  
Test Method ◽  
Wafer Level ◽  
Eutectic Bonding ◽  
Electrical Test

Electrical test method of open defects at data buses in 3D SRAM IC

2014 ◽  
Author(s):  
Yudai Shiraishi ◽  
Masaki Hashizume ◽  
Hiroyuki Yotsuyanagi ◽  
Tetsuo Tada ◽  
Shyue-Kung Lu
Keyword(s):  
Test Method ◽  
Electrical Test ◽  
Open Defects ◽  
Data Buses

New electrical test method for LCD cell-manufacturing process

2008 ◽  
Vol 16 (1) ◽  
pp. 83 ◽  
Author(s):  
Yasuhiro Miyake ◽  
Kiyoshi Chikamatsu ◽  
Junichi Mizoguchi
Keyword(s):  
Manufacturing Process ◽  
Test Method ◽  
Electrical Test ◽  
Cell Manufacturing

scholarly journals Electrical Test Method for Interconnect Open Defects in 3D ICs

2012 ◽  
Vol 5 (1) ◽  
pp. 26-33 ◽  
Author(s):  
Tomoaki Konishi ◽  
Hiroyuki Yotsuyanagi ◽  
Masaki Hashizume
Keyword(s):  
Test Method ◽  
Electrical Test ◽  
3D Ics ◽  
Open Defects

A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches

2014 ◽  
Vol 104 (6) ◽  
pp. 061908 ◽  
Author(s):  
C. Ryan ◽  
Z. Olszewski ◽  
R. Houlihan ◽  
C. O'Mahony ◽  
R. Duane
Keyword(s):  
Test Method ◽  
Electrical Test
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