DFT for supply current testing to detect open defects at interconnects in 3D ICs

2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) ◽

10.1109/edaps.2013.6724389 ◽

2013 ◽

Cited By ~ 3

Author(s):

Shohei Suenaga ◽

Masaki Hashizume ◽

Hiroyuki Yotsuyanagi ◽

Shyue-Kung Lu ◽

Zvi Roth

Keyword(s):

Current Testing ◽

3D Ics ◽

Supply Current ◽

Open Defects

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A built-in test circuit for supply current testing of open defects at interconnects in 3D ICs

2012 4th Electronic System-Integration Technology Conference ◽

10.1109/estc.2012.6542127 ◽

2012 ◽

Cited By ~ 10

Author(s):

Tomoaki Konishi ◽

Hiroyuki Yotsuyanagi ◽

Masaki Hashizume

Keyword(s):

Current Testing ◽

3D Ics ◽

Test Circuit ◽

Supply Current ◽

Open Defects

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Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture

2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International ◽

10.1109/3dic.2012.6262968 ◽

2012 ◽

Cited By ~ 12

Author(s):

Tomoaki Konishi ◽

Hiroyuki Yotsuyanagi ◽

Masaki Hashizume

Keyword(s):

Current Testing ◽

3D Ics ◽

Supply Current ◽

Ieee 1149.1 ◽

Open Defects

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Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

ETRI Journal ◽

10.4218/etrij.01.0101.0205 ◽

2001 ◽

Vol 23 (2) ◽

pp. 77-84 ◽

Cited By ~ 14

Author(s):

Doe-Hyun Yoon Yoon ◽

Hong-Sik Kim Kim ◽

Sungho Kang Kang

Keyword(s):

Power Supply ◽

Dynamic Power ◽

Current Testing ◽

Supply Current ◽

Open Defects ◽

Dynamic Power Supply Current

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Supply current testing in linear bipolar ICs

Electronics Letters ◽

10.1049/el:19940088 ◽

1994 ◽

Vol 30 (2) ◽

pp. 128-130 ◽

Cited By ~ 17

Author(s):

D.K. Papakostas ◽

A.A. Hatzopoulos

Keyword(s):

Current Testing ◽

Supply Current

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Pin open detection of BGA IC by supply current testing

2014 International Conference on Electronics Packaging (ICEP) ◽

10.1109/icep.2014.6826695 ◽

2014 ◽

Author(s):

Akira Ono ◽

Hiroyuki Yotsuyanagi ◽

Masaki Hashizume

Keyword(s):

Current Testing ◽

Supply Current

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Power supply current testing in the production line of emergency luminaire circuits

2008 15th IEEE International Conference on Electronics, Circuits and Systems ◽

10.1109/icecs.2008.4674969 ◽

2008 ◽

Cited By ~ 1

Author(s):

Michael G. Dimopoulos ◽

Dimitris K. Papakostas ◽

Alexios D. Spyronasios ◽

Alkis A. Hatzopoulos ◽

Dimitrios K. Konstantinou

Keyword(s):

Power Supply ◽

Production Line ◽

Current Testing ◽

Supply Current

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Test input vectors for supply current testing of TTL combinational circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224436 ◽

2003 ◽

Cited By ~ 4

Author(s):

M. Hashizume ◽

T. Tamesada ◽

I. Tsukimoto

Keyword(s):

Combinational Circuits ◽

Current Testing ◽

Test Input ◽

Supply Current

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Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing

Second IEEE International Workshop on Electronic Design, Test and Applications ◽

10.1109/delta.2004.10031 ◽

2005 ◽

Cited By ~ 3

Author(s):

S. Thomas ◽

R. Makki ◽

Sai Kishore Vavilala

Keyword(s):

Current Testing ◽

Measurement And Analysis ◽

Supply Current ◽

Physical Defects

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A built-in supply current test circuit for electrical interconnect tests of 3D ICs

2014 International 3D Systems Integration Conference (3DIC) ◽

10.1109/3dic.2014.7152148 ◽

2014 ◽

Cited By ~ 6

Author(s):

Masaki Hashizume ◽

Shoichi Umezu ◽

Hiroyuki Yotsuyanagi ◽

Shyue-Kung Lu

Keyword(s):

Current Test ◽

3D Ics ◽

Test Circuit ◽

Supply Current

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A built-in defective level monitor of resistive open defects in 3D ICs with logic gates

2016 IEEE CPMT Symposium Japan (ICSJ) ◽

10.1109/icsj.2016.7801299 ◽

2016 ◽

Cited By ~ 1

Author(s):

Masaki Hashizume ◽

Akihiro Odoriba ◽

Hiroyuki Yotsuyanagi ◽

Shyue-Kung Lu

Keyword(s):

Logic Gates ◽

3D Ics ◽

Open Defects ◽

Resistive Open Defects

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