Extraction of material properties for low-K and low-loss dielectrics using cavity resonator and efficient finite difference solver up to 40GHz

2008 ◽  
Author(s):  
Seunghyun E. Hwang ◽  
M. Swaminathan ◽  
V. Venkatakrishnan
Keyword(s):  
Finite Difference ◽  
Material Properties ◽  
Cavity Resonator ◽  
Low Loss ◽  
Low K

Porous ultra low k deposited by PECVD: From deposition to material properties

2007 ◽  
Vol 201 (22-23) ◽  
pp. 9248-9251 ◽  
Author(s):  
V. Jousseaume ◽  
L. Favennec ◽  
A. Zenasni ◽  
O. Gourhant
Keyword(s):  
Material Properties ◽  
Low K

Spreadsheet solutions of elastic plate–beam problems

1990 ◽  
Vol 17 (6) ◽  
pp. 931-939
Author(s):  
Gregory E. Small ◽  
Sidney H. Simmonds
Keyword(s):  
Finite Difference ◽  
Material Properties ◽  
Iterative Solution ◽  
Difference Operators ◽  
Structural Systems ◽  
Convergence Criteria ◽  
Spreadsheet Program ◽  
Structural Problem ◽  
Special Computer Program ◽  
Slab Bending

Spreadsheets are among the most common microcomputer programs used by engineers because they provide an easy means of formulating equations in algebraic format. By introducing appropriate stiffness equations with numerical values representative of material properties, boundary conditions, and loading, spreadsheet templates can be developed to model specific structural systems. These equations are mutually dependent and may be solved using the iteration techniques that are part of the spreadsheet program. A common structural problem that is difficult to solve without a special computer program is the analysis of a slab arbitrarily supported on elastic beams and columns. The use of readily available spreadsheet programs to solve this problem is demonstrated. Equations for slab bending and for beams with finite flexural and torsional stiffnesses are derived using finite difference operators. These equations are then recast into a form more convenient for an iterative solution. The use of these equations is demonstrated with numerical examples. Key words: analysis, convergence criteria, deflections, finite difference, plates, spreadsheets.

Porous Low-k Dielectrics: Material Properties

2004 ◽  
pp. 161-172 ◽  
Author(s):  
C. Tyberg ◽  
E. Huang ◽  
J. Hedrick ◽  
E. Simonyi ◽  
S. Gates ◽  
...  
Keyword(s):  
Material Properties ◽  
Low K

Low-loss microwave filters on CMOS-grade standard silicon substrate with low-k BCB dielectric

2003 ◽  
Vol 40 (1) ◽  
pp. 9-11 ◽  
Author(s):  
Lydia L. W. Leung ◽  
Kevin J. Chen ◽  
Xiao Huo ◽  
Philip C. H. Chan
Keyword(s):  
Silicon Substrate ◽  
Microwave Filters ◽  
Low Loss ◽  
Low K

Effect of ultraviolet curing wavelength on low-k dielectric material properties and plasma damage resistance

2011 ◽  
Vol 519 (11) ◽  
pp. 3619-3626 ◽  
Author(s):  
Premysl Marsik ◽  
Adam M. Urbanowicz ◽  
Patrick Verdonck ◽  
David De Roest ◽  
Hessel Sprey ◽  
...  
Keyword(s):  
Material Properties ◽  
Dielectric Material ◽  
Ultraviolet Curing ◽  
Plasma Damage ◽  
Damage Resistance ◽  
Low K
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