Solder Mobility for High-Yield Self-Aligned Flip-Chip Assembly

Author(s):  
Yves Martin ◽  
Swetha Kamlapurkar ◽  
Jae-Woong Nah ◽  
Nathan Marchack ◽  
Tymon Barwicz
Author(s):  
Daniel J. Hyman ◽  
Roger Kuroda

XCom Wireless is a small business specializing in RF MEMS-enabled tunable filters and phase shifters for next-generation communications systems. XCom has developed a high-yielding flip-chip assembly and packaging technique for implementing RF MEMS devices into fully-packaged chip-scale hybrid integrated circuitry for radio and microwave frequency applications through 25 GHz. This paper discusses the packaging approach employed, performance and reliability aspects, and lessons learned. The packaging is similar to a hybrid module approach, with discrete RF MEMS component dies flip-chipped into larger packages containing large-area integrated passives. The first level of interconnect is a pure gold flip chip for high yield strength and reliability with small dies. The use of first-level flip-chip and second-level BGAs allows the extremely large bandwidth MEMS devices to maintain high performance characteristics.


Author(s):  
Shengmin Wen ◽  
KyungRok Park ◽  
Patrick Thompson ◽  
Dwayne Shirley ◽  
JeongSeok Lee ◽  
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1993 ◽  
Vol 115 (1) ◽  
pp. 63-70 ◽  
Author(s):  
Sa-Yoon Kang ◽  
H. Xie ◽  
Y. C. Lee

Flip-Chip connections using gold-to-gold, gold-to-aluminum, or gold-to-solder bondings or contacts enhanced by epoxy are low-cost alternatives to soldering. To assist their technology advancements, we have developed yield models for a representative assembly process with flip-chip, thermocompression bondings. Based on bonding mechanics, a physical yield model has been developed to characterize the process. Then, a fuzzy logic model has been established to improve the modeling’s accuracy by including experimental data. The physical yield model can predict the assembly yield as a function of forces and planarities of the end effector, bump height variations, bump geometries, mechanical properties corresponding to different materials and temperatures, and distribution patterns of bumps. Consistent with our experimental experience, the calculated force level for a high-yield process was around 3000 gmf for a 30-gold-bump chip with a bump diameter of 60 μm and a height of 50 μm. The fuzzy logic model can be trained and adjusted by the results of physical models and experiments. It correlates very well to the nonlinear relationships between the yield and the assembly parameters, and has a self-learning capability to update itself with new data. Such capabilities have been demonstrated by studying the bonding on a substrate with or without a compliant layer.


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