Pico-second signal transient characterization technique of meanders through s-parameter measurement in high-speed PWB interconnects

2002 ◽  
Author(s):  
Yong-Ju Kim ◽  
Jo-Han Kim ◽  
Hyo-Seog Ryu ◽  
Young-Suk Suh ◽  
Jae-Kyung Wee ◽  
...  
Keyword(s):  
High Speed ◽  
Parameter Measurement ◽  
Characterization Technique ◽  
S Parameter

Electrical modeling of ball grid array packages based on one-port S-parameter measurement for electrical evaluation of high-speed test board

2005 ◽  
Vol 5 (3) ◽  
pp. 271-276
Author(s):  
Seungki Nam ◽  
Jaehoon Lee ◽  
Yonggyoo Kim ◽  
Kyun-Hyun Tchah ◽  
Jaeyong Jeong ◽  
...  
Keyword(s):  
High Speed ◽  
Ball Grid Array ◽  
Parameter Measurement ◽  
Electrical Modeling ◽  
Speed Test ◽  
S Parameter ◽  
Test Board ◽  
Ball Grid Array Packages

scholarly journals Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

2020 ◽  
Vol 68 (8) ◽  
pp. 3558-3564
Author(s):  
Aihua Wu ◽  
Chen Liu ◽  
Faguo Liang ◽  
Xuefeng Zou ◽  
Yibang Wang ◽  
...  
Keyword(s):  
Measurement Method ◽  
Parameter Measurement ◽  
S Parameter

New 3D-TRL structures for on-wafer calibration For high frequency S-parameter measurement

2015 ◽  
Author(s):  
Potereau Manuel ◽  
Sebastien Fregonese ◽  
Arnaud Curutchet ◽  
Peter Baureis ◽  
Thomas Zimmer
Keyword(s):  
High Frequency ◽  
Parameter Measurement ◽  
S Parameter
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