S-parameter-measurement-based high-speed signal transient characterization of VLSI interconnects on SiO/sub 2/-Si substrate

2000 ◽  
Vol 23 (3) ◽  
pp. 470-479 ◽  
Author(s):  
Yungseon Eo ◽  
W.R. Eisenstadt ◽  
Jongin Shim
Keyword(s):  
High Speed ◽  
Parameter Measurement ◽  
Si Substrate ◽  
Vlsi Interconnects ◽  
S Parameter

Electrical modeling of ball grid array packages based on one-port S-parameter measurement for electrical evaluation of high-speed test board

2005 ◽  
Vol 5 (3) ◽  
pp. 271-276
Author(s):  
Seungki Nam ◽  
Jaehoon Lee ◽  
Yonggyoo Kim ◽  
Kyun-Hyun Tchah ◽  
Jaeyong Jeong ◽  
...  
Keyword(s):  
High Speed ◽  
Ball Grid Array ◽  
Parameter Measurement ◽  
Electrical Modeling ◽  
Speed Test ◽  
S Parameter ◽  
Test Board ◽  
Ball Grid Array Packages

Fabrication and characterization of novel high-speed InGaAs/InP uni-traveling-carrier photodetector for high responsivity

2015 ◽  
Vol 24 (10) ◽  
pp. 108506
Author(s):  
Qing-Tao Chen ◽  
Yong-Qing Huang ◽  
Jia-Rui Fei ◽  
Xiao-Feng Duan ◽  
Kai Liu ◽  
...  
Keyword(s):  
High Speed ◽  
High Responsivity ◽  
Fabrication And Characterization

scholarly journals Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Electronics ◽  
2021 ◽  
Vol 10 (11) ◽  
pp. 1275
Author(s):  
Simone Scafati ◽  
Enza Pellegrino ◽  
Francesco de Paulis ◽  
Carlo Olivieri ◽  
James Drewniak ◽  
...  
Keyword(s):  
Standard Technique ◽  
Single Step ◽  
Scattering Parameters ◽  
Linear Set ◽  
S Parameter ◽  
Parameter Conversion ◽  
Before And After ◽  
One Step ◽  
Typical Measurement

The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.

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