Studies on Ni-Sn intermetallic compound and P-rich Ni layer at the electroless nickel UBM-solder interface and their effects on flip chip solder joint reliability

2002 ◽  
Author(s):  
Young-Doo Jeon ◽  
Kyung-Wook Paik ◽  
Kyoung-Soon Bok ◽  
Woo-Suk Choi ◽  
Chul-Lae Cho
Keyword(s):  
Intermetallic Compound ◽  
Solder Joint ◽  
Flip Chip ◽  
Electroless Nickel ◽  
Solder Joint Reliability ◽  
Joint Reliability ◽  
Solder Interface

Experimental evaluation of SnAgCu solder joint reliability in 100-μm pitch flip-chip assemblies

2014 ◽  
Vol 54 (5) ◽  
pp. 939-944 ◽  
Author(s):  
Ye Tian ◽  
Xi Liu ◽  
Justin Chow ◽  
Yi Ping Wu ◽  
Suresh K. Sitaraman
Keyword(s):  
Solder Joint ◽  
Experimental Evaluation ◽  
Flip Chip ◽  
Solder Joint Reliability ◽  
Snagcu Solder ◽  
Joint Reliability

Evaluation of solder joint reliability in flip chip package under thermal shock test

2006 ◽  
Vol 504 (1-2) ◽  
pp. 426-430 ◽  
Author(s):  
Dae-Gon Kim ◽  
Jong-Woong Kim ◽  
Seung-Boo Jung
Keyword(s):  
Solder Joint ◽  
Thermal Shock ◽  
Flip Chip ◽  
Thermal Shock Test ◽  
Solder Joint Reliability ◽  
Shock Test ◽  
Joint Reliability

FCBGA Footprints and Solder Joint Reliability

2004 ◽  
Author(s):  
Frank Z. Liang ◽  
Rick L. Williams
Keyword(s):  
Solder Joint ◽  
Flip Chip ◽  
Electrical Performance ◽  
Solder Joint Reliability ◽  
Routing Optimization ◽  
Joint Reliability ◽  
Cost Constraints ◽  
Package Size ◽  
Empirical Tests ◽  
The One

As electronic package input/output density increases and cost constraints drive the package size smaller, the one area where a designer can not compromise is solder joint reliability. Maintaining flip chip ball grid array (FCBGA) solder joint reliability (SJR) has been at the top of the designer’s critical list with decreasing package size. The FCBGA footprint will need to be modified for a variety of reasons to meet routing optimization, power delivery, electrical performance to name a few. The designer must deal with several competing proposals (electrical performance, cost and use conditions) trying to optimize the FCBGA footprint while being aware that some modifications can negatively affect SJR. This paper investigates solder ball layouts and their effect on SJR through both finite element (FE) models and empirical tests. In addition, consideration of next generation layout is presented to optimize routability while preserving SJR. When feasible, empirical tests were run to validate predictive models.

Solder Joint Reliability Improvement Using the Cold Ball Pull Metrology

2005 ◽  
Author(s):  
George F. Raiser ◽  
Dudi Amir
Keyword(s):  
Solder Joint ◽  
Electroless Nickel ◽  
Lead Free ◽  
Attractive Alternative ◽  
Lead Free Solder ◽  
Solder Joint Reliability ◽  
Solder Interconnect ◽  
Joint Reliability ◽  
Test Conditions ◽  
Free Solder

The various methods for improvement of package solder joint reliability (SJR) have centered on the broad categories of (i) reductions in the thermomechanical and mechanical stresses and strains applied to the joints, and (ii) strengthening of the solder interconnect interfaces and materials themselves. In practice, the success of the former depends first and foremost on the latter — an adequate and consistent interconnect ‘strength’ during the package development and production cycles. With the advancement of various pad-plating technologies (most notably ENIG – Electroless Nickel Immersion Gold), sphere chemistries, fluxes and processing conditions, each with their own stability issues, the interconnect strengths can easily undergo seemingly random drifts over time. The Dage™ Cold Ball Pull (CBP) technique, however, has emerged as an attractive alternative to the traditional ball-shear metrology as an interconnect strength monitor. The open issues preventing its adoption are related to identifying the best test conditions (e.g. aging time, pull speed, jaw pressure, etc...), all of which are addressed here. After identifying the best test conditions, we present a number of experimental results that highlight the powerful capability of this tool for optimizing and monitoring solder-joint strength. A full metrology characterization to demonstrate accuracy, repeatability and reproducibility has been performed. Moreover, interesting results have been obtained with respect to solder-aging, multiple-reflow, and time-above-liquidus effects on interconnect strength. Examples of direct correlation between CBP measurements and solder-joint shock performance are demonstrated. CBP is also shown to correlate well to other strength metrologies, such as three-point bend. Finally, CBP is used here to show how to strengthen interconnects by the proper selection of pad plating chemistries, sphere compositions, fluxes, reflow conditions, etc… Maintaining those strengths through development and production can be handled effectively using CBP as a monitor. Looking forward, CBP data presented here shows that certain material and processing choices can maximize lead-free solder interconnect strength and lead-free solder joint reliability.

Sign in / Sign up

Export Citation Format

Share Document