An improved peel stress-based correlation to predict solder joint reliability of lidded flip chip ball grid array packages
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2006 ◽
Vol 36
(1)
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pp. 6-16
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1999 ◽
Vol 11
(1)
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pp. 44-48
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2000 ◽
Vol 12
(2)
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pp. 16-23
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1996 ◽
Vol 19
(4)
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pp. 728-735
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