Gradual Diagnostic Test Generation Based on the Structural Distance between Indistinguished Fault Pairs

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2010.49 ◽

2010 ◽

Cited By ~ 5

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Structural Distance

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Gradual Diagnostic Test Generation and Observation Point Insertion Based on the Structural Distance Between Indistinguished Fault Pairs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2138729 ◽

2012 ◽

Vol 20 (6) ◽

pp. 1026-1035 ◽

Cited By ~ 9

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Observation Point ◽

Structural Distance

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Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation

Journal of Electronic Testing ◽

10.1007/s10836-010-5142-2 ◽

2010 ◽

Vol 26 (2) ◽

pp. 165-176 ◽

Cited By ~ 8

Author(s):

Maheshwar Chandrasekar ◽

Nikhil P. Rahagude ◽

Michael S. Hsiao

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Incremental Learning ◽

Learning Framework

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Diagnostic Test Generation for Arbitrary Faults

2006 IEEE International Test Conference ◽

10.1109/test.2006.297647 ◽

2006 ◽

Cited By ~ 14

Author(s):

Naresh Bhatti ◽

R.D. Blanton

Keyword(s):

Diagnostic Test ◽

Test Generation

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A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.845083 ◽

2000 ◽

Vol 19 (5) ◽

pp. 589-600 ◽

Cited By ~ 20

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Generation Procedure

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Output-Dependent Diagnostic Test Generation

2010 23rd International Conference on VLSI Design ◽

10.1109/vlsi.design.2010.13 ◽

2010 ◽

Cited By ~ 11

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation

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A diagnostic test generation system and a coverage metric

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512739 ◽

2010 ◽

Cited By ~ 2

Author(s):

Yu Zhang ◽

Vishwani D. Agrawal

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Generation System

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On adaptive diagnostic test generation

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) ◽

10.1109/iccad.1995.480010 ◽

2002 ◽

Cited By ~ 10

Author(s):

Y. Gong ◽

S. Chakravarty

Keyword(s):

Diagnostic Test ◽

Test Generation

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Diagnostic Test Generation Targeting Equivalence Classes

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388029 ◽

2007 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Equivalence Classes

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Test and non-test cubes for diagnostic test generation based on merging of test cubes

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 ◽

10.7873/date.2014.143 ◽

2014 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Diagnostic Test ◽

Test Generation

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Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

Journal of Electronic Testing ◽

10.1007/s10836-014-5490-4 ◽

2014 ◽

Vol 30 (6) ◽

pp. 763-780 ◽

Cited By ~ 1

Author(s):

Yu Zhang ◽

Bei Zhang ◽

Vishwani D. Agrawal

Keyword(s):

Fault Detection ◽

Diagnostic Test ◽

Test Generation ◽

Delay Faults ◽

Transition Delay

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