A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits

I. Pomeranz; S.M. Reddy

doi:10.1109/43.845083

A diagnostic test generation procedure based on test elimination by vector omission for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.845083 ◽

2000 ◽

Vol 19 (5) ◽

pp. 589-600 ◽

Cited By ~ 20

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Generation Procedure

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A diagnostic test generation procedure for synchronous sequential circuits based on test elimination

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743306 ◽

2002 ◽

Cited By ~ 31

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Generation Procedure

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On the Use of Functional Test Generation in Diagnostic Test Generation for Synchronous Sequential Circuits

Electronic Notes in Theoretical Computer Science ◽

10.1016/j.entcs.2006.12.031 ◽

2007 ◽

Vol 174 (4) ◽

pp. 83-93

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Sequential Circuits ◽

Functional Test ◽

Synchronous Sequential Circuits

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TEMPLATES: a test generation procedure for synchronous sequential circuits

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643923 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Generation Procedure

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Test generation for synchronous sequential circuits to reduce storage requirements

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741655 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits

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Test generation for synchronous sequential circuits using multiple observation times

[1991] Digest of Papers. Fault-Tolerant Computing: The Twenty-First International Symposium ◽

10.1109/ftcs.1991.146632 ◽

2002 ◽

Cited By ~ 34

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Observation Times

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Test generation for synchronous sequential circuits based on fault extraction

1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers ◽

10.1109/iccad.1991.185301 ◽

2002 ◽

Cited By ~ 8

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits

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Built-in test generation for synchronous sequential circuits

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) ICCAD-97 ◽

10.1109/iccad.1997.643570 ◽

1997 ◽

Cited By ~ 21

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Synchronous Sequential Circuits

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A diagnostic test generation procedure for combinational circuits based on test elimination

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741661 ◽

2002 ◽

Cited By ~ 7

Author(s):

I. Pomeranz ◽

W.K. Fuchs

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Combinational Circuits ◽

Generation Procedure

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Functional test generation for synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.503950 ◽

1996 ◽

Vol 15 (7) ◽

pp. 831-843 ◽

Cited By ~ 4

Author(s):

M.K. Srinivas ◽

J. Jacob ◽

V.D. Agrawal

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Functional Test ◽

Synchronous Sequential Circuits

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MIX: a test generation system for synchronous sequential circuits

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646649 ◽

2002 ◽

Cited By ~ 15

Author(s):

Xijiang Lin ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

Generation System ◽

Synchronous Sequential Circuits

Download Full-text