On Utilizing Test Cube Properties to Reduce Test Data Volume Further

Scan test data volume reduction in multi-clocked designs with safe capture technique

Proceedings. International Test Conference ◽

10.1109/test.2002.1041755 ◽

2003 ◽

Cited By ~ 22

Author(s):

V. Jain ◽

J. Waicukauski

Keyword(s):

Test Data ◽

Volume Reduction ◽

Scan Test ◽

Data Volume ◽

Capture Technique

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Input Test Data Volume Reduction Using Seed Complementation and Multiple LFSRs

2020 IEEE 38th VLSI Test Symposium (VTS) ◽

10.1109/vts48691.2020.9107617 ◽

2020 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Test Data ◽

Volume Reduction ◽

Data Volume ◽

Input Test

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A Unified Approach to Test Generation and Test Data Volume Reduction

2006 IEEE International Test Conference ◽

10.1109/test.2006.297644 ◽

2006 ◽

Cited By ~ 3

Author(s):

Yung-chieh Lin ◽

Kwang-ting Cheng

Keyword(s):

Test Data ◽

Test Generation ◽

Volume Reduction ◽

Unified Approach ◽

Data Volume

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Low power Illinois scan architecture for simultaneous power and test data volume reduction

2008 Design, Automation and Test in Europe ◽

10.1145/1403375.1403486 ◽

2008 ◽

Cited By ~ 11

Author(s):

Anshuman Chandra ◽

Felix Ng ◽

Rohit Kapur

Keyword(s):

Low Power ◽

Test Data ◽

Volume Reduction ◽

Data Volume

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Low Power Test-Compression for High Test-Quality and Low Test-Data Volume

2011 Asian Test Symposium ◽

10.1109/ats.2011.75 ◽

2011 ◽

Cited By ~ 6

Author(s):

Vasileios Tenentes ◽

Xrysovalantis Kavousianos

Keyword(s):

Low Power ◽

Test Data ◽

Test Quality ◽

Power Test ◽

Test Compression ◽

Low Power Test ◽

Data Volume ◽

High Test

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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e92.d.1462 ◽

2009 ◽

Vol E92-D (7) ◽

pp. 1462-1465 ◽

Cited By ~ 2

Author(s):

Yongjoon KIM ◽

Myung-Hoon YANG ◽

Jaeseok PARK ◽

Eunsei PARK ◽

Sungho KANG

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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Efficient space/time compression to reduce test data volume and testing time for IP cores

18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design ◽

10.1109/icvd.2005.87 ◽

2005 ◽

Cited By ~ 14

Author(s):

Lei Li ◽

K. Chakrabarty ◽

S. Kajihara ◽

S. Swaminathan

Keyword(s):

Test Data ◽

Space Time ◽

Testing Time ◽

Time Compression ◽

Data Volume ◽

Ip Cores

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An on-chip combinational decompressor for reducing test data volume

2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings ◽

10.1109/iscas.2006.1692871 ◽

2006 ◽

Author(s):

Jie Don ◽

Yu Hu ◽

Yinhe Han ◽

Xiaowei Li

Keyword(s):

Test Data ◽

Data Volume ◽

On Chip

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Progressive random access scan: a simultaneous solution to test power, test data volume and test time

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1583994 ◽

2006 ◽

Cited By ~ 1

Author(s):

Dong Hyun Baik ◽

K.K. Saluja

Keyword(s):

Test Data ◽

Random Access ◽

Test Time ◽

Simultaneous Solution ◽

Test Power ◽

Power Test ◽

Data Volume

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On combining pinpoint test set relaxation and run-length codes for reducing test data volume

Proceedings 21st International Conference on Computer Design ◽

10.1109/iccd.2003.1240925 ◽

2004 ◽

Cited By ~ 3

Author(s):

S. Kajihara ◽

Y. Doi ◽

Lei Li ◽

Krishnendu Chakrabarty

Keyword(s):

Test Data ◽

Test Set ◽

Run Length ◽

Data Volume

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