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Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test

LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

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Vol 34 (6) ◽  
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Xun Sun ◽  
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Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
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Low Power ◽  
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Tianwang Li ◽  
Qian Zhao ◽  
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Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Power Test ◽  
Low Power Test ◽  
Self Test ◽  
Built In Self Test
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