scholarly journals Deep submicrometer SOI MOSFET drain current model including series resistance, self-heating and velocity overshoot effects

2000 ◽  
Vol 21 (5) ◽  
pp. 239-241 ◽  
Author(s):  
J.B. Roldan ◽  
F. Gamiz ◽  
J.A. Lopez-Villanueva ◽  
P. Cartujo-Cassinello
2015 ◽  
Vol 103 ◽  
pp. 154-161 ◽  
Author(s):  
Mohammad K. Anvarifard ◽  
Ali A. Orouji

1998 ◽  
Vol 45 (10) ◽  
pp. 2249-2251 ◽  
Author(s):  
J.B. Roldan ◽  
F. Gamiz ◽  
J.A. Lopez-Villanueva ◽  
P. Cartujo ◽  
J.E. Carceller

2019 ◽  
Vol 9 (2) ◽  
pp. 291-297
Author(s):  
Hind Jaafar ◽  
Abdellah Aouaj ◽  
Ahmed Bouziane ◽  
Benjamin Iñiguez

Background: A novel Dual Material Gate Graded Channel and Dual Oxide Thickness Cylindrical Gate (DMG-GC-DOT) MOSFET is presented in this paper. Methods: Analytical model of drain current is developed using a quasi-two-dimensional cylindrical form of the Poisson equation and is expressed as a function of the surface potential, which is calculated using the expressions of the current density. Results: Comparison of the analytical results with 3D numerical simulations using Silvaco Atlas - TCAD software presents a good agreement from subthreshold to strong inversion regime and for different bias voltages. Conclusion: Two oxide thicknesses with different permittivity can effectively improve the subthreshold current of DMG-GC-DOT MOSFET.


Sign in / Sign up

Export Citation Format

Share Document