A new charge pumping method for determining the spatial distribution of hot-carrier-induced fixed charge in p-MOSFETs

1993 ◽  
Vol 40 (10) ◽  
pp. 1768-1779 ◽  
Author(s):  
M. Tsuchiaki ◽  
H. Hara ◽  
T. Morimoto ◽  
H. Iwai
Keyword(s):  
Spatial Distribution ◽  
Fixed Charge ◽  
Charge Pumping ◽  
Hot Carrier

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-$k$ Gated MOSFETs by a Modified Charge Pumping Technique

2014 ◽  
Vol 61 (4) ◽  
pp. 936-942 ◽  
Author(s):  
Chun-Chang Lu ◽  
Kuei-Shu Chang-Liao ◽  
Che-Hao Tsao ◽  
Tien-Ko Wang ◽  
Hsueh-Chao Ko ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Charge Pumping ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress
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