Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements
2007 ◽
Vol 47
(4-5)
◽
pp. 508-512
◽
Keyword(s):
2008 ◽
Vol E91-C
(5)
◽
pp. 742-746
◽
2006 ◽
Vol 50
(2)
◽
pp. 170-176
◽
Keyword(s):