AC hot-carrier effects in MOSFETs with furnace N/sub 2/O-nitrided gate oxides

1992 ◽  
Vol 13 (6) ◽  
pp. 341-343 ◽  
Author(s):  
G.Q. Lo ◽  
J. Ahn ◽  
D.-L. Kwong
Keyword(s):  
Gate Oxides ◽  
Hot Carrier ◽  
Hot Carrier Effects

Hot Carrier Effects in Deep Submicron Nmosfets

1996 ◽  
Vol 428 ◽  
Author(s):  
Abhijit Phanse ◽  
Samar Saha
Keyword(s):  
Electric Fields ◽  
Channel Length ◽  
Deep Submicron ◽  
Short Channel ◽  
Hot Carrier ◽  
Velocity Saturation ◽  
Substrate Current ◽  
Hot Carrier Effects ◽  
Saturation Effects ◽  
Channel Lengths

AbstractThis paper addresses hot-carrier related reliability issues in deep submicron silicon nMOSFET devices. In order to monitor the hot-carrier induced device degradation, the substrate current was measured for devices with varying channel lengths (20 um - 0.24 um) under various biasing conditions. Deep submicron devices experience velocity saturation of channel carriers due to extremely high lateral electric fields. To evaluate the effects of velocity saturation in the channel, the pinch-off length in the channel was extracted for all the devices of the target technology. It was observed that for very short channel devices, carriers in most of the channel experience velocity saturation and almost the entire channel gets pinched off. It is shown in this paper that for very short channel devices, the pinch-off length in the channel is limited by the effective channel length, and that velocity saturation effects are critical to the transport of channel carriers.

Electrical characteristics and hot carrier effects in quantum well solar cells

2017 ◽  
Author(s):  
Dac-Trung Nguyen ◽  
Laurent Lombez ◽  
Francois Gibelli ◽  
Myriam Paire ◽  
Soline Boyer-Richard ◽  
...  
Keyword(s):  
Solar Cells ◽  
Quantum Well ◽  
Electrical Characteristics ◽  
Hot Carrier ◽  
Hot Carrier Effects

Improved hot-carrier immunity in CMOS analog device with N/sub 2/O-nitrided gate oxides

1992 ◽  
Vol 13 (9) ◽  
pp. 457-459 ◽  
Author(s):  
G.Q. Lo ◽  
J. Ahn ◽  
D.-L. Kwong
Keyword(s):  
Analog Device ◽  
Gate Oxides ◽  
Hot Carrier

scholarly journals Floating Body and Hot Carrier Effects in Ultra-Thin Film SOI MOSFETs

1996 ◽  
Vol 06 (C3) ◽  
pp. C3-49-C3-54 ◽  
Author(s):  
S.-H. Renn ◽  
C. Raynaud ◽  
F. Balestra
Keyword(s):  
Thin Film ◽  
Floating Body ◽  
Hot Carrier ◽  
Hot Carrier Effects ◽  
Ultra Thin Film

Dependence of hot-carrier immunity on channel length and channel width in MOSFETs with N/sub 2/O-grown gate oxides

1992 ◽  
Vol 13 (12) ◽  
pp. 651-653 ◽  
Author(s):  
G.Q. Lo ◽  
J. Ahn ◽  
D.-L. Kwong ◽  
K.K. Young
Keyword(s):  
Channel Length ◽  
Channel Width ◽  
Gate Oxides ◽  
Hot Carrier
Sign in / Sign up

Export Citation Format

Share Document