A CMOS fault extractor for inductive fault analysis

F.J. Ferguson; J.P. Shen

doi:10.1109/43.9188

A CMOS fault extractor for inductive fault analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.9188 ◽

1988 ◽

Vol 7 (11) ◽

pp. 1181-1194 ◽

Cited By ~ 158

Author(s):

F.J. Ferguson ◽

J.P. Shen

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Exploiting Regularity for Inductive Fault Analysis

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.35 ◽

2006 ◽

Author(s):

J.G. Brown ◽

R.D.S. Blanton

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Digital CMOS Fault Modeling and Inductive Fault Analysis

Defect Oriented Testing for CMOS Analog and Digital Circuits - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-4926-7_2 ◽

1999 ◽

pp. 15-63

Author(s):

Manoj Sachdev

Keyword(s):

Fault Modeling ◽

Fault Analysis ◽

Digital Cmos ◽

Inductive Fault Analysis

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Inductive fault analysis revisited

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0046 ◽

1991 ◽

Vol 138 (2) ◽

pp. 253 ◽

Cited By ~ 4

Author(s):

F. Corsi ◽

C. Morandi

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) ◽

10.1109/vtest.1997.600249 ◽

2002 ◽

Cited By ~ 8

Author(s):

Z. Jaworski ◽

M. Niewczas ◽

W. Kuzmicz

Keyword(s):

Analog Circuits ◽

Test Generation ◽

Fault Analysis ◽

Parametric Faults ◽

Inductive Fault Analysis

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Inductive Fault Analysis of MOS Integrated Circuits

IEEE Design & Test of Computers ◽

10.1109/mdt.1985.294793 ◽

1985 ◽

Vol 2 (6) ◽

pp. 13-26 ◽

Cited By ~ 381

Author(s):

John Shen ◽

W. Maly ◽

F. Ferguson

Keyword(s):

Integrated Circuits ◽

Fault Analysis ◽

Inductive Fault Analysis

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Inductive fault analysis of surface-micromachined MEMS

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.855926 ◽

2006 ◽

Vol 25 (6) ◽

pp. 1104-1116 ◽

Cited By ~ 6

Author(s):

Tao Jiang ◽

R.D. Blanton

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

8th International Symposium on Quality Electronic Design (ISQED'07) ◽

10.1109/isqed.2007.90 ◽

2007 ◽

Author(s):

Daniela De Venuto ◽

Bruno Ricco

Keyword(s):

Sensor Arrays ◽

Fault Analysis ◽

Dna Sensor ◽

Inductive Fault Analysis

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Rapid inductive fault analysis for high-yield circuits

Microelectronics Journal ◽

10.1016/s0026-2692(01)00138-0 ◽

2002 ◽

Vol 33 (3) ◽

pp. 279-284 ◽

Cited By ~ 1

Author(s):

A Platts ◽

D Taylor

Keyword(s):

Fault Analysis ◽

High Yield ◽

Inductive Fault Analysis

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Digital CMOS Fault Modeling and Inductive Fault Analysis

Integrated Circuit Manufacturability ◽

10.1109/9780470544921.ch3 ◽

2009 ◽

Keyword(s):

Fault Modeling ◽

Fault Analysis ◽

Digital Cmos ◽

Inductive Fault Analysis

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Cache RAM inductive fault analysis with fab defect modeling

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743275 ◽

2002 ◽

Cited By ~ 18

Author(s):

T.M. Mak ◽

D. Bhattacharya ◽

C. Prunty ◽

B. Roeder ◽

N. Ramadan ◽

...

Keyword(s):

Fault Analysis ◽

Defect Modeling ◽

Inductive Fault Analysis

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