Reliable tantalum-gate fully-depleted-SOI MOSFET technology featuring low-temperature processing
1997 ◽
Vol 44
(9)
◽
pp. 1467-1472
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Keyword(s):
Keyword(s):
Keyword(s):
2008 ◽
Vol 5
(1)
◽
pp. 29-36
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2006 ◽
Vol 118
(1-2)
◽
pp. 105-109
◽
2017 ◽
Vol 13
◽
pp. 232-240
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Keyword(s):
Keyword(s):